17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII)

ISSN: 0361-5235 (Print) 1543-186X (Online)

In this topical collection (34 articles)

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  1. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    The Role of Defects in the Resistive Switching Behavior of Ta2O5-TiO2-Based Metal–Insulator–Metal (MIM) Devices for Memory Applications

    S. Dueñas, H. Castán, H. García, O. G. Ossorio… Pages 4938-4943

  2. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Depth Profile of Impurity Phase in Wide-Bandgap Cu(In1−x,Gax)Se2 Film Fabricated by Three-Stage Process

    Shenghao Wang, Takehiro Nazuka, Hideki Hagiya… Pages 4944-4949

  3. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Electrical Characterization of Graphite/InP Schottky Diodes by I–V–T and C–V Methods

    Stanislav Tiagulskyi, Roman Yatskiv, Jan Grym Pages 4950-4954

  4. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation

    Iván Santos, Manuel Ruiz, María Aboy, Luis A. Marqués… Pages 4955-4958

  5. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices

    Jens W. Tomm, Robert Kernke, Giovanna Mura… Pages 4959-4963

  6. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Mechanical Stress in InP Structures Etched in an Inductively Coupled Plasma Reactor with Ar/Cl2/CH4 Plasma Chemistry

    Jean-Pierre Landesman, Daniel T. Cassidy, Marc Fouchier… Pages 4964-4969

  7. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Defect-Related Electroluminescence in the 1.2–1.7 μm Range from Boron-Implanted Silicon at Room Temperature

    Yuhan Gao, Hao Shen, Jiahao Cao, Dongsheng Li… Pages 4970-4974

  8. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Band-Like Behavior of Localized States of Metal Silicide Precipitate in Silicon

    Anton Bondarenko, Oleg Vyvenko Pages 4975-4979

  9. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Defect Characterization, Imaging, and Control in Wide-Bandgap Semiconductors and Devices

    L. J. Brillson, G. M. Foster, J. Cox, W. T. Ruane… Pages 4980-4986

  10. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Optical Characterizations of VCSEL for Emission at 850 nm with Al Oxide Confinement Layers

    Merwan Mokhtari, Philippe Pagnod-Rossiaux… Pages 4987-4992

  11. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Energy Levels of Defects Created in Silicon Supersaturated with Transition Metals

    H. García, H. Castán, S. Dueñas, E. García-Hemme… Pages 4993-4997

  12. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    LVM Spectroscopy Investigation of Complex Defects in InAs Single Crystals Grown by the LEC Method

    Guiying Shen, Youwen Zhao, Jingming Liu, Yongbiao Bai… Pages 4998-5001

  13. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Influence of the Interaction Between Graphite and Polar Surfaces of ZnO on the Formation of Schottky Contact

    R. Yatskiv, J. Grym Pages 5002-5006

  14. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Observation of Threading Dislocations in Ammonothermal Gallium Nitride Single Crystal Using Synchrotron X-ray Topography

    Y. Yao, Y. Ishikawa, Y. Sugawara, Y. Takahashi… Pages 5007-5012

  15. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Electrical Characterization of Defects Created by γ-Radiation in HfO2-Based MIS Structures for RRAM Applications

    H. García, M. B. González, M. M. Mallol, H. Castán… Pages 5013-5018

  16. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Effect of Germanium Doping on the Production and Evolution of Divacancy Complexes in Neutron Irradiated Czochralski Silicon

    Peng Dong, Ping Yang, Xuegong Yu, Lin Chen, Yao Ma… Pages 5019-5024

  17. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Design and Photovoltaic Properties of Graphene/Silicon Solar Cell

    Dikai Xu, Xuegong Yu, Lifei Yang, Deren Yang Pages 5025-5032

  18. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Characterization of the Failure Site Distribution in MIM Devices Using Zoomed Wavelet Analysis

    J. Muñoz-Gorriz, S. Monaghan, K. Cherkaoui, J. Suñé… Pages 5033-5038

  19. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    Effects of Iron Contamination and Hydrogen Passivation on the Electrical Properties of Oxygen Precipitates in CZ-Si

    Jiyang Li, Lihui Song, Xuegong Yu, Deren Yang Pages 5039-5044

  20. No Access

    Topical Collection: 17th Conference on Defects (DRIP XVII)

    W and X Photoluminescence Centers in Crystalline Si: Chasing Candidates at Atomic Level Through Multiscale Simulations

    María Aboy, Iván Santos, Pedro López, Luis A. Marqués… Pages 5045-5049
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