Overview
Part of the book series: NATO Science Series II: Mathematics, Physics and Chemistry (NAII, volume 185)
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Keywords
Table of contents (39 papers)
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Reliability and Operation of SOI Devices in Harsh Environment
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Radiation Effects
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Characterization and Simulation of SOI Devices Operating under Harsh Environment
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Novel SOI Devices and Sensors Operating at Harsh Conditions
Editors and Affiliations
Bibliographic Information
Book Title: Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment
Book Subtitle: Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment, Kiev, Ukraine, 26-30 April 2004
Editors: Denis Flandre, Alexei N. Nazarov, Peter L.F. Hemment
Series Title: NATO Science Series II: Mathematics, Physics and Chemistry
DOI: https://doi.org/10.1007/1-4020-3013-4
Publisher: Springer Dordrecht
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media B.V. 2005
Hardcover ISBN: 978-1-4020-3011-6Published: 15 February 2005
Softcover ISBN: 978-1-4020-3012-3Published: 15 February 2005
eBook ISBN: 978-1-4020-3013-0Published: 06 May 2006
Series ISSN: 1568-2609
Edition Number: 1
Number of Pages: XII, 348
Topics: Electronics and Microelectronics, Instrumentation, Optical and Electronic Materials, Automotive Engineering, Electrical Engineering, Microwaves, RF and Optical Engineering
Industry Sectors: Aerospace, Automotive, Chemical Manufacturing, Electronics, Energy, Utilities & Environment, IT & Software, Materials & Steel, Telecommunications