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Radiation Effects in Advanced Semiconductor Materials and Devices

  • Book
  • © 2002

Overview

Authors:
  1. Cor Claeys

    1. IMEC Leuven/Belgium, Leuven, Belgium

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  2. Eddy Simoen

    1. IMEC Leuven/Belgium, Leuven, Belgium

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    You can also search for this author in PubMed   Google Scholar

  • This book summarizes the current knowledge of radiation defects in semiconductors
  • It will be a useful reference work for scientists involved in semiconductor processing.- This book is important for space applications of semiconductors and solar cells.- It provides information on the application of sensors in nuclear power plants.

Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 57)

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Table of contents (9 chapters)

  1. Front Matter

    Pages I-XXII
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  2. Radiation Environments and Component Selection Strategy

    • Cor Claeys, Eddy Simoen
    Pages 1-8

  3. Basic Radiation Damage Mechanisms in Semiconductor Materials and Devices

    • Cor Claeys, Eddy Simoen
    Pages 9-52

  4. Displacement Damage in Group IV Semiconductor Materials

    • Cor Claeys, Eddy Simoen
    Pages 53-108

  5. Radiation Damage in GaAs

    • Cor Claeys, Eddy Simoen
    Pages 109-144

  6. Space Radiation Aspects of Silicon Bipolar Technologies

    • Cor Claeys, Eddy Simoen
    Pages 145-180

  7. Radiation Damage in Silicon MOS Devices

    • Cor Claeys, Eddy Simoen
    Pages 181-244

  8. GaAs Based Field Effect Transistors for Radiation-Hard Applications

    • Cor Claeys, Eddy Simoen
    Pages 245-280

  9. Opto-Electronic Components for Space

    • Cor Claeys, Eddy Simoen
    Pages 281-330

  10. Advanced Semiconductor Materials and Devices—Outlook

    • Cor Claeys, Eddy Simoen
    Pages 331-350

  11. Back Matter

    Pages 351-404
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Keywords

About this book

In the modern semiconductor industry, there is a growing need to understand and combat potential radiation damage problems. Space applications are an obvious case, but, beyond that, today's device and circuit fabrication rely on increasing numbers of processing steps that involve an aggressive environment where inadvertant radiation damage can occur. This book is both aimed at post-graduate researchers seeking an overview of the field, and will also be immensely useful for nuclear and space engineers and even process engineers. A background knowledge of semiconductor and device physics is assumed, but the basic concepts are all briefly summarized. Finally the book outlines the shortcomings of present experimental and modeling techniques and gives an outlook on future developments.

Authors and Affiliations

  • IMEC Leuven/Belgium, Leuven, Belgium

    Cor Claeys, Eddy Simoen

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