Abstract
The previous chapters have been addressing a large variety of materials and devices that are nowadays commonly used in different radiation applications. However, the radiation community also watches the trend in the microelectronics world very carefully. Therefore, new materials and device structures are already in an early phase also studied from a viewpoint of their performance in a radiation envi ronment. This chapter aims at briefly addressing some of these materials and de-vices. Within the scope of the book and due to space restrictions the attention is given to potentially very promising directions with applications in the near future.
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Claeys, C., Simoen, E. (2002). Advanced Semiconductor Materials and Devices—Outlook. In: Radiation Effects in Advanced Semiconductor Materials and Devices. Springer Series in Materials Science, vol 57. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-04974-7_9
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DOI: https://doi.org/10.1007/978-3-662-04974-7_9
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-07778-4
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