Access this book
Tax calculation will be finalised at checkout
Other ways to access
About this book
Similar content being viewed by others
Keywords
Table of contents (80 papers)
-
X-Ray Optics and Components
-
X-Ray Microscopes and Imaging Systems
Editors and Affiliations
Bibliographic Information
Book Title: X-Ray Microscopy II
Book Subtitle: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987
Editors: David Sayre, Janos Kirz, Malcolm Howells, Harvey Rarback
Series Title: Springer Series in Optical Sciences
DOI: https://doi.org/10.1007/978-3-540-39246-0
Publisher: Springer Berlin, Heidelberg
-
eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 1988
Softcover ISBN: 978-3-662-14490-9Published: 03 October 2013
eBook ISBN: 978-3-540-39246-0Published: 05 June 2013
Series ISSN: 0342-4111
Series E-ISSN: 1556-1534
Edition Number: 1
Number of Pages: XIV, 455
Number of Illustrations: 286 b/w illustrations, 2 illustrations in colour
Industry Sectors: Aerospace, Electronics, Energy, Utilities & Environment, IT & Software, Telecommunications