Skip to main content

X-Ray Microscopy II

Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987

  • Conference proceedings
  • © 1988

Overview

Part of the book series: Springer Series in Optical Sciences (SSOS, volume 56)

This is a preview of subscription content, log in via an institution to check access.

Access this book

eBook USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

Licence this eBook for your library

Institutional subscriptions

About this book

This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub­ ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im­ portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre­ sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou­ bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con­ tributions and for their efforts in adhering to the guidelines on manuscript preparation.

Similar content being viewed by others

Keywords

Table of contents (80 papers)

  1. Introduction

  2. X-Ray Sources

  3. X-Ray Optics and Components

Editors and Affiliations

  • IBM T.J. Watson Research Center, Yorktown Heights, USA

    David Sayre

  • Department of Physics, State University of New York, Stony Brook, USA

    Janos Kirz

  • Center for X-Ray Optics, Lawrence Berkeley Laboratory, University of California at Berkeley, Berkeley, USA

    Malcolm Howells

  • National Synchrotron Light Source, Brookhaven National Laboratory, Upton, USA

    Harvey Rarback

Bibliographic Information

Publish with us