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X-Ray Microscopy II pp 70–79Cite as

Theoretical Investigations of Imaging Properties of Zone Plates Using Diffraction Theory

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Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 56))

Abstract

Based on Kirchhoff’s diffraction theory, the modulation transfer function MTF has been calculated as a criterion for the imaging quality of a micro zone plate. The micro zone plate will be used for imaging with high magnification in x-ray microscopes. The optical arrangement of an x-ray microscope is sketched in Fig.1 [1].

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References

  1. G. Schmahl, D. Rudolph, B. Niemann and O. Christ: “Zone Plate X-Ray Microscopy”, Quarterly Reviews of Biophysics 13, 297–315 (1980)

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  2. B. Niemann, D. Rudolph and G. Schmahl: “Soft X-Ray Imaging Zone Plates with Large Zone Numbers for Microscopic and Spectroscopic Applications”. Optics Communications 12, 160–163 (1974)

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  3. D. Rudolph, B. Niemann, G. Schmahl: “Status of the Sputtered Sliced Zone Plates for X-Ray Microscopy”, SPIE Proceedings 316, 103–105 (1982)

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  4. M. Born, E. Wolf: Principles of Optics, 6th ed., ( Pergamon Press, Oxford 1980 )

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  5. L. Bergmann, C. Schaefer: Lehrbuch der Experimentalphysik, Band III, Optik, 6th ed. (de Gruyter, Berlin 1974 )

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  6. H.H. Fink: Untersuchungen zum Punktbild und zur Modulationsübertragungsfunktion Fresne1scher Zonenplatten im optischen Spektralbereich, Dissertation, Universität Tübingen 1975.

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  7. A.G. Michette: Optical Systems for Soft X-Rays, ( Plenum Press, New York 1986 )

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  8. D. Rudolph and G. Schmahl: “High Power Zone Plates for a Soft X-Ray Microscope”. Ann. NY Acad. Sci. 342, 94–104 (1980)

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  9. G. Schmahl, D. Rudolph, P. Guttmann and O. Christ: “Zone Plates for X-Ray Microscopy” in X-Ray Microscopy, ed. by G. Schmahl, D. Rudolph, Springer Series in Optical Sciences 43. 63–74 ( Springer, Heidelberg 1984 )

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Author information

Authors and Affiliations

  1. Forschungsgruppe Röntgenmikroskopie, Universität Göttingen, Geiststraße 11, D-3400, Göttingen, Fed. Rep. of Germany

    J. Thieme

Authors
  1. J. Thieme
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Editor information

Editors and Affiliations

  1. IBM T.J. Watson Research Center, 10598, Yorktown Heights, NY, USA

    David Sayre Ph. D.

  2. Department of Physics, State University of New York, 11794, Stony Brook, NY, USA

    Janos Kirz Ph. D.

  3. Center for X-Ray Optics, Lawrence Berkeley Laboratory, University of California at Berkeley, 1 Cyclotron Rd., 94720, Berkeley, CA, USA

    Malcolm Howells Ph. D.

  4. National Synchrotron Light Source, Brookhaven National Laboratory, 11973, Upton, NY, USA

    Harvey Rarback Ph. D.

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© 1988 Springer-Verlag Berlin Heidelberg

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Thieme, J. (1988). Theoretical Investigations of Imaging Properties of Zone Plates Using Diffraction Theory. In: Sayre, D., Kirz, J., Howells, M., Rarback, H. (eds) X-Ray Microscopy II. Springer Series in Optical Sciences, vol 56. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-39246-0_14

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  • DOI: https://doi.org/10.1007/978-3-540-39246-0_14

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-14490-9

  • Online ISBN: 978-3-540-39246-0

  • eBook Packages: Springer Book Archive

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