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Bragg-Fresnel Optics: Principles and Prospects of Applications

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Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 56))

Abstract

Possibilities of control and focusing of X-rays have been discussed repeatedly since the discovery made by Röntgen. It turned out, however, that applications of the principles of optical element fabrication adopted in visible light, infrared radiation and other wavelength ranges are rather limited due to negligible difference of the refractive index from unity, a relatively large absorption coefficient and the necessity to fabricate optical elements with the accuracy compared to a radiation wavelength. In the last years the methods of X-ray optics acquire further extensive development because of the advances in microstructuring technology, namely, structure fabrication with element sizes up to one hundred angströms, sputtering technology and that of the growth of thin films of different materials, and due to the advances in the investigation of X-ray diffraction. In our opinion, at present there exists a possibility to set and solve the task of fabricating effective focusing X-ray elements with the structure of three-dimensional Fresnel zones, that is, Bragg Fresnel optics. These elements can be made on the basis of multilayer interference mirrors for the nanometer wavelength range (0.5nm≲λ≲10nm) and semiconductor perfect crystals with heterostructures for the wavelength range of 0.1Å≲λ≲5Å. The principal peculiarity of Bragg-Fresnel X-ray elements lies in the fact that coherent Bragg scattering by separate layers is used in them. As it will be shown, this phenomenon permits increasing their diffraction efficiency, widening the spectrum range and angular aperture and gives a possibility to realize amplitude and phase modulations of radiation, to switch X-ray elements by an electrical signal, ultrasound and light signals.

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References

  1. A.V. Baez: J. Opt. Soc. Am. 42, 756 (1952).

    Article  ADS  Google Scholar 

  2. V.V. Aristov, E.V. Shulakov: Kristallographiya (1987) (in press).

    Google Scholar 

  3. E.V. Shulakov, V.V. Aristov: The Theory of Diffraction Fresnel Topography of Perfect and Defect Crystals, J. Appl. Cryst. (1987) (in press).

    Google Scholar 

  4. V.V. Aristov, V.Sh. Shekhtman: Uspekhi fizicheskih nauk 104, 1, 51 (1971).

    Article  Google Scholar 

  5. V.V. Aristov, A.A. Snigirev, Yu.A. Basov, A.Yu. Nikulin: AIP Conf. Proc. 147, 253 (1986).

    Article  ADS  Google Scholar 

  6. V.V. Aristov, Yu.A. Basov, A.A. Snigirev: Pisma v ZhETF 13, 2, 144 (1987).

    Google Scholar 

  7. V.V. Aristov, Yu.A. Basov, S.V. Redkin, A.A Snigirev, V.A. Yunkin: Nucl. Instr. Methods (1987) (in press).

    Google Scholar 

  8. V.V. Aristov, S.V. Gaponov, V.M. Genkin, Yu.A. Gorbatov, A.I. Erko, V.V. Martynov, Z.A. Matveeva, N.N. Salashchenko, A.A. Frayerman: Pisma v ZhETF 44, 4, 207 (1986).

    Google Scholar 

  9. V.U. Aristov, E.V. Shulakov: X-Ray Optical Diffraction Elements on the Basis of Heterostructures, Optics Comm. (1987) (in press).

    Google Scholar 

  10. Here we consider Si(555) reflection, λ = 0.0709nm(Mo Ko), R =40 cm, a= 3.24pm, extinction depth A = λ sin θ/|γ H|= 89 μm.

    Google Scholar 

  11. The index of refraction for X-rays A— O.1nm differs from unity by the magnitude of an order 10-5-10-6, so that a common change in a transmitted wave is possible by a material of about 10 pm thick.

    Google Scholar 

  12. U. Bonze, M. Hart: Appl. Phys. Letters 6, 155 (1965).

    Article  ADS  Google Scholar 

  13. V.V. Aristov, A.I. Erko, A.Yu. Nikulin, A.A. Snigirev: Opt. Comm. 58, 5, 300 (1986).

    Article  ADS  Google Scholar 

  14. V.V. Aristov, A.Yu. Nikulin, A.A. Snigirev, P. Zaumseil: Phys. stat. sol. (a) 95, 81 (1986).

    Article  ADS  Google Scholar 

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© 1988 Springer-Verlag Berlin Heidelberg

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Aristov, V.V. (1988). Bragg-Fresnel Optics: Principles and Prospects of Applications. In: Sayre, D., Kirz, J., Howells, M., Rarback, H. (eds) X-Ray Microscopy II. Springer Series in Optical Sciences, vol 56. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-39246-0_19

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  • DOI: https://doi.org/10.1007/978-3-540-39246-0_19

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-14490-9

  • Online ISBN: 978-3-540-39246-0

  • eBook Packages: Springer Book Archive

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