Abstract
Soft x-ray mirrors have been used as focussing elements in x-ray microscopes and other x-ray optics. Mirror surfaces must be figured very accurately and must be as smooth as possible to suppress unwanted x-ray scattering by surface irregularities. Since the production of supersmooth films for the soft x-ray multilayer mirror is our main concern, the most straight forward way to examine this quality is to measure the x-ray scattering in the same wavelength band which the mirror has been designed for.
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References
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© 1988 Springer-Verlag Berlin Heidelberg
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Nakajima, K., Aoki, S. (1988). Scattering Measurements of Soft X-Ray Mirrors. In: Sayre, D., Kirz, J., Howells, M., Rarback, H. (eds) X-Ray Microscopy II. Springer Series in Optical Sciences, vol 56. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-39246-0_30
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DOI: https://doi.org/10.1007/978-3-540-39246-0_30
Publisher Name: Springer, Berlin, Heidelberg
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