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Zone Plates for the Nanometer Wavelength Range

  • Conference paper
Book cover X-Ray Microscopy II

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 56))

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Abstract

The development of efficient optical elements for focusing and image transmission at soft X-ray wavelengths (0.5 nm – 10 nm) opens the way for realization of new methods in X-ray microscopy, local photoelectron analysis, plasma physics, astronomy, etc. In fact, only the last decade has witnessed the appearance of technological possibilities for fabricating high resolution X-ray diffractive elements thanks to advanced methods in microelectronics technology.

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Literature

  1. J. Kirz: J. Opt. Soc. Amer. 64, 301 (1974).

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  5. V.V. Aristov, S.V. Gaponov, V.M. Genkin, Yu.A. Gorbatov, A.I. Erko, V.V. Martynov, L.A. Matveeva, N.N. Salaschenko, A.A. Fraerman: Pisma Zh. Eksp. Teor. Fis. (USSR), 44, 207 (1986).

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Author information

Authors and Affiliations

  1. Institute of Problems of Microelectronics Technology and Superpure Materials, USSR Academy of Sciences, 142432, Chernogolovka, Moscow District, USSR

    V. V. Aristov, A. I. Erko, L. A. Panchencko, V. V. Martynov, S. V. Redkin & G. D. Sazonova

Authors
  1. V. V. Aristov
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  2. A. I. Erko
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  3. L. A. Panchencko
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  4. V. V. Martynov
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  5. S. V. Redkin
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  6. G. D. Sazonova
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Editor information

Editors and Affiliations

  1. IBM T.J. Watson Research Center, 10598, Yorktown Heights, NY, USA

    David Sayre Ph. D.

  2. Department of Physics, State University of New York, 11794, Stony Brook, NY, USA

    Janos Kirz Ph. D.

  3. Center for X-Ray Optics, Lawrence Berkeley Laboratory, University of California at Berkeley, 1 Cyclotron Rd., 94720, Berkeley, CA, USA

    Malcolm Howells Ph. D.

  4. National Synchrotron Light Source, Brookhaven National Laboratory, 11973, Upton, NY, USA

    Harvey Rarback Ph. D.

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© 1988 Springer-Verlag Berlin Heidelberg

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Aristov, V.V., Erko, A.I., Panchencko, L.A., Martynov, V.V., Redkin, S.V., Sazonova, G.D. (1988). Zone Plates for the Nanometer Wavelength Range. In: Sayre, D., Kirz, J., Howells, M., Rarback, H. (eds) X-Ray Microscopy II. Springer Series in Optical Sciences, vol 56. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-39246-0_23

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  • DOI: https://doi.org/10.1007/978-3-540-39246-0_23

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-14490-9

  • Online ISBN: 978-3-540-39246-0

  • eBook Packages: Springer Book Archive

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