Testability Concepts for Digital ICs

The Macro Test Approach

  • F. P. M. Beenker
  • R. G. Bennetts
  • A. P. Thijssen

Part of the Frontiers in Electronic Testing book series (FRET, volume 3)

Table of contents

  1. Front Matter
    Pages i-ix
  2. F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 1-8
  3. F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 9-17
  4. F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 19-40
  5. F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 41-79
  6. F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 81-105
  7. F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 107-138
  8. F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 139-169
  9. F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen
    Pages 171-191
  10. Back Matter
    Pages 193-212

About this book

Introduction

Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on. All four items have to be treated, managed, and to a great extent integrated before the term 'IC quality' gets a certain meaning and a test a certain measurable value. The contents of this book reflects our activities on testability concepts for complex digital ICs as performed at Philips Research Laboratories in Eindhoven, The Netherlands. Based on the statements above, we have worked along a long­ term plan, which was based on four pillars. 1. The definition of a test methodology suitable for 'future' IC design styles, 2. capable of handling improved defect models, 3. supported by software tools, and 4. providing an easy link to Automatic Test Equipment. The reasoning we have followed was continuously focused on IC qUality. Quality expressed in terms of the ability of delivering a customer a device with no residual manufacturing defects. Bad devices should not escape a test. The basis of IC quality is a thorough understanding of defects and defect models.

Keywords

CMOS VLSI communication control development filter integrated circuit manufacturing stability testing

Authors and affiliations

  • F. P. M. Beenker
    • 1
  • R. G. Bennetts
    • 2
  • A. P. Thijssen
    • 3
  1. 1.Philips Medical SystemsThe Netherlands
  2. 2.Synopsys, Inc.USA
  3. 3.TU DelftThe Netherlands

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4615-2365-9
  • Copyright Information Springer Science+Business Media Dordrecht 1995
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4613-6004-9
  • Online ISBN 978-1-4615-2365-9
  • Series Print ISSN 0929-1296
  • About this book
Industry Sectors
Pharma
Automotive
Biotechnology
Electronics
Telecommunications
Energy, Utilities & Environment
Aerospace