Abstract
The key problem in the electronics industry is the need to improve quality and productivity while reducing costs. This is a simple statement; however, it influences every step of a product-development cycle. For integrated circuits, these development cycles are the design, manufacture and testing cycles. All three cycles have their own specific demands on the information required to improve their productivity and yield. The information packages are clearly correlated; see Figure 2.1.
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© 1995 Springer Science+Business Media Dordrecht
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Beenker, F.P.M., Bennetts, R.G., Thijssen, A.P. (1995). Defect-Oriented Testing. In: Testability Concepts for Digital ICs. Frontiers in Electronic Testing, vol 3. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-2365-9_2
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DOI: https://doi.org/10.1007/978-1-4615-2365-9_2
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