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Table of contents (5 chapters)
Keywords
About this book
Editors and Affiliations
Bibliographic Information
Book Title: Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
Editors: Alvin W. Czanderna, Theodore E. Madey, Cedric J. Powell
Series Title: Methods of Surface Characterization
DOI: https://doi.org/10.1007/b119182
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 2002
Hardcover ISBN: 978-0-306-45896-5Published: 31 October 1998
Softcover ISBN: 978-1-4419-3299-0Published: 06 December 2010
eBook ISBN: 978-0-306-46914-5Published: 11 April 2006
Edition Number: 1
Number of Pages: XX, 430
Topics: Characterization and Evaluation of Materials, Optical and Electronic Materials, Analytical Chemistry
Industry Sectors: Aerospace, Biotechnology, Chemical Manufacturing, Consumer Packaged Goods, Electronics, Energy, Utilities & Environment, Engineering, Materials & Steel, Oil, Gas & Geosciences