62nd Electronic Materials Conference 2020

ISSN: 0361-5235 (Print) 1543-186X (Online)

In this topical collection (11 articles)

  1. No Access

    Topical Collection: 62nd Electronic Materials Conference 2020

    Growth Parameter Based Control of Cation Disorder in MgSnN2 Thin Films

    Krystal R. York, Robert A. Makin, Nancy Senabulya Pages 2949-2955
  2. No Access

    Topical Collection: 62nd Electronic Materials Conference 2020

    X-ray Topography Characterization of GaN Substrates Used for Power Electronic Devices

    Yafei Liu, Hongyu Peng, Tuerxun Ailihumaer Pages 2981-2989
  3. No Access

    Topical Collection: 62nd Electronic Materials Conference 2020

    Effect of GaN Substrate Properties on Vertical GaN PiN Diode Electrical Performance

    James C. Gallagher, Travis J. Anderson Pages 3013-3021
  4. No Access

    Topical Collection: 62nd Electronic Materials Conference 2020

    Comparative Apex Electrostatics of Atom Probe Tomography Specimens

    Qihua Zhang, Benjamin Klein, Norman A. Sanford Pages 3022-3029