62nd Electronic Materials Conference 2020
In this topical collection (11 articles)
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Topical Collection: 62nd Electronic Materials Conference 2020
Light Emission Study of Free-Standing Quasi-2D-γ-Alumina Grown by Graphene-Assisted Atomic Layer Deposition
E. Kheirandish, N. Kouklin Pages 2943-2948 -
Topical Collection: 62nd Electronic Materials Conference 2020
Growth Parameter Based Control of Cation Disorder in MgSnN2 Thin Films
Krystal R. York, Robert A. Makin, Nancy Senabulya… Pages 2949-2955 -
Topical Collection: 62nd Electronic Materials Conference 2020
Electrical Properties of 6 nm to 19 nm Thick Polyethylene Oxide Capacitors for Ion/Electron Functional Devices
Karla Adriana Gonzalez-Serrano, Alan C. Seabaugh Pages 2956-2963 -
Topical Collection: 62nd Electronic Materials Conference 2020
Continuous-Wave Laser Lateral Crystallization of A-Si Thin Films on Polyimide Using a Heatsink Layer Embedded in the Buffer SiO2
Nobuo Sasaki, Muhammad Arif, Yukiharu Uraoka, Jun Gotoh… Pages 2974-2980 -
Topical Collection: 62nd Electronic Materials Conference 2020
X-ray Topography Characterization of GaN Substrates Used for Power Electronic Devices
Yafei Liu, Hongyu Peng, Tuerxun Ailihumaer… Pages 2981-2989 -
Topical Collection: 62nd Electronic Materials Conference 2020
Optical Characterization of Gallium Oxide α and β Polymorph Thin-Films Grown on c-Plane Sapphire
Leila Ghadbeigi, Jacqueline Cooke, Giang T. Dang… Pages 2990-2998 -
Topical Collection: 62nd Electronic Materials Conference 2020
Preparation of Alloys and Investigation of Phase Equilibria in the CuFeS2−δ–CuGaS2 System
Barys Korzun, Anatoly Pushkarev, Aliaksandr Zhaludkevich… Pages 2999-3005 -
Topical Collection: 62nd Electronic Materials Conference 2020
Characterization of Hazy Morphology on AlInP/GaAs Epitaxial Wafers Grown by Organometallic Vapor-Phase Epitaxy
Hongyu Peng, Tuerxun Ailihumaer, Yafei Liu… Pages 3006-3012 -
Topical Collection: 62nd Electronic Materials Conference 2020
Effect of GaN Substrate Properties on Vertical GaN PiN Diode Electrical Performance
James C. Gallagher, Travis J. Anderson… Pages 3013-3021 -
Topical Collection: 62nd Electronic Materials Conference 2020
Comparative Apex Electrostatics of Atom Probe Tomography Specimens
Qihua Zhang, Benjamin Klein, Norman A. Sanford… Pages 3022-3029
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