Physics and Materials Science of High Temperature Superconductors, IV

  • Ram Kossowsky
  • Miroslav Jelinek
  • Josef Novak

Part of the NATO ASI Series book series (ASHT, volume 26)

Table of contents

  1. Front Matter
    Pages i-xii
  2. Physics and Theory

  3. Processing and Properties — Crystals

    1. Front Matter
      Pages 127-127
    2. J. T. Markert, K. Mochizuki, T. C. Messina, B. C. Dunn, A. V. Elliott
      Pages 151-160
    3. J. Herrmann, M. C. De Andrade, R. P. Dickey, C. C. Almasan, M. B. Maple, Wu Jiang et al.
      Pages 161-178
    4. Yuri Obukhov, V. Yu. Pomjakushin, A. A. Zakharov, A. A. Nikonov
      Pages 179-185
    5. I. Sargánková, W. König, M. Mair, G. Gritzner, J. Kováč, S. Longauer et al.
      Pages 199-204
    6. S. A. Nedilko, V. A. Drozd
      Pages 205-211
  4. Processing and Properties — Thin Films

    1. Front Matter
      Pages 213-213
    2. M. Jelínek, V. Trtík, L. Jastrabík
      Pages 215-231

About this book


Five questions dominated the ARW on Physics and Materials Science of High Temperature Superconductors, of which this book forms the permanent record. Briefly, these are: (i) How close are we to a unified theory? The consensus is that we are not. (ii) Flux pinning: can it be achieved in bulk materials? Still an open question. The following three questions are related. (iii) Can grain boundary contributions be brought under control? (iv) What is the real requirement for purity and general chemistry control? (v)What is the practical outlook for bulk products - tapes and wires? One of the conclusions is that the geometry and dimensions in thin films are the key parameters that facilitate the realization of high current densities and, consequently, their commercial application. On the other hand, the very large number of poorly understood microstructural, chemical and mechanical variables involved in the preparation of bulk materials are currently prohibiting large scale commercialization of wires and tapes.


BCS theory HTS Josephson junction Penetration depth Superconductor crystal microscopy thin film

Editors and affiliations

  • Ram Kossowsky
    • 1
  • Miroslav Jelinek
    • 2
  • Josef Novak
    • 3
  1. 1.Emerging Technologies, Inc.PittsburghUSA
  2. 2.Physics InstituteCzech Academy of SciencePragueCzech Republic
  3. 3.Institute of Electrical EngineeringSlovak Academy of ScienceBratislavaSlovak Republic

Bibliographic information

  • DOI
  • Copyright Information Kluwer Academic Publishers 1997
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-94-010-6417-0
  • Online ISBN 978-94-011-5732-2
  • Series Print ISSN 1388-6576
  • About this book
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