Advanced Materials Nanocharacterization
ISSN:
2731-9229 (Online)
In this topical collection (28 articles)
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Nano Express
Scaling properties of ballistic nano-transistors
Ulrich Wulf, Marcus Krahlisch, Hans Richter Article:365 -
Nano Express
Micro-spectroscopy on silicon wafers and solar cells
Paul Gundel, Martin C Schubert, Friedemann D Heinz… Article:197 -
Nano Express
Characterization of silicon heterojunctions for solar cells
Jean-Paul Kleider, Jose Alvarez… Article:152
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