65th Electronic Materials Conference 2023

In this topical collection (6 articles)

1. 

   Topical Collection: 65th Electronic Materials Conference 2023

   Field Emission Properties of Top–Down GaN Nanowires Characterized in Vacuum by a Nanometer-Resolution Piezoelectric Probing System

   G. Doundoulakis, D. Pavlidis Pages 2773-2780

2. 

   Topical Collection: 65th Electronic Materials Conference 2023

   Straight-Line-Shaped Grooves Induced by Agglomeration in Thin Si Films Obtained by the Continuous-wave Laser Crystallization of A-Si on Insulator

   Nobuo Sasaki, Satoshi Takayama, Rikuto Sasai… Pages 2781-2788

3. 

   Topical Collection: 65th Electronic Materials Conference 2023

   Formation of Spontaneous Lateral Heterostructures in High Al content Al_xGa_1−xN Alloys Grown by High-Temperature Plasma-Assisted Molecular Beam Epitaxy

   Wendy L. Sarney, Mihee Ji, Asher C. Leff… Pages 2789-2797

4. 

   Topical Collection: 65th Electronic Materials Conference 2023

   PtO_x Schottky Contacts on Degenerately Doped \(\left( {\overline{2}01} \right)\) β-Ga₂O₃ Substrates

   Joseph A. Spencer, Alan G. Jacobs, Karl D. Hobart… Pages 2798-2805

5. 

   Topical Collection: 65th Electronic Materials Conference 2023

   Study of Dopant Activation and Ionization for Phosphorus in 4H-SiC

   Suman Das, Daniel J. Lichtenwalner, Hemant Dixit… Pages 2806-2810

6. 

   Topical Collection: 65th Electronic Materials Conference 2023

   Silicon Ion Implant Activation in β-(Al_0.2Ga_0.8)₂O₃

   Alan G. Jacobs, Joseph A. Spencer, Marko J. Tadjer… Pages 2811-2816