Abstract
Parameters of infrared heating for soldering electronic components using surface mounting are investigated and optimized. The main advantages of IR heating are as follows: high rate, low lag effect, possibility to effectively change the temperature and time profile of heating, and the relative simplicity of the equipment.
Similar content being viewed by others
References
Zvorykin, D.B., Prokhorov, Yu.I., Primenenie luchistogo infrakrasnogo nagreva v elektronnoi promyshlennosti (Application of Radiant Infrared Heating in Electronic Industry), Moscow: Energiya, 1980.
Henderson, I., Browne, V., IR Plus Hot Platen Heating Offers Another Option for Reflow Soldering, EPP, 1989, vol. 29, no. 9, pp. 78–80.
Wassink, K.R.J., Soldering in Electronics, Electrochem. Publ., Ayr (Scotland), 1989.
Kundas, S.P., Dostanko, A.P., Anufriev, L.P., et al., Tekhnologiya poverkhnostnogo montazha (Technology of Surface Mounting), Minsk: Armita, 2000.
Manko, H.H., Solders and Soldering: Materials, Design, Production and Analysis for Reliable Bonding, N.Y., 2000.
Lanin, V.L., Efficiency of Heating by Means of Concentrated Flows of Energy in the Soldering Process in Electronics, Elektron. Obrab. Mater., 2002, no. 2, pp. 17–20.
Lanin, V.L., Kapralov, V.V., Infrared Heating in the Surface Mounting Technology, Problemy proektirovaniya i proizvodstva radioelektronnykh sredstv: Materialy III Mezhdunarodnoi nauchno-tekhnich. konf. (Problems of Development and Production of Radioelectronic Means: Proc. III Int. Sci. and Techn. Conf.), vol. 1, Novopolotsk, 2004, pp. 81–84.
Lanin, V.L., Khil’kevich, A.N., Double Sided Surface Mounting of Electronic Modules, Izvestiya Belorusskoi Inzhenernoi Akademii, 2003, no. 1(15)/4, pp. 145–147.
Author information
Authors and Affiliations
Additional information
Original Russian Text © V.L. Lanin, 2007, published in Elektronnaya Obrabotka Materialov, 2007, No. 5, pp. 91–96.
About this article
Cite this article
Lanin, V.L. Infrared heating in the technology of soldering components in electronics. Surf. Engin. Appl.Electrochem. 43, 381–386 (2007). https://doi.org/10.3103/S1068375507050134
Received:
Issue Date:
DOI: https://doi.org/10.3103/S1068375507050134