Abstract
Optical fringe pattern processing and analysis [1] plays crucial role in metrological applications (e.g., interferometry, moiré and structured illumination methods). It might be often a troublesome task because of fringe pattern defects such as noise, uneven background, low modulation and generally complex fringe shapes in a wide spatial frequency range. In this paper we present adaptive optical fringe pattern processing (filtering and normalization) techniques, robust to mentioned pattern imperfections, based on the empirical mode decomposition (EMD).
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Patorski, K., Trusiak, M., Wielgus, M. (2014). Fast Adaptive Processing of Low Quality Fringe Patterns by Automated Selective Reconstruction and Enhanced Fast Empirical Mode Decomposition. In: Osten, W. (eds) Fringe 2013. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-36359-7_25
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DOI: https://doi.org/10.1007/978-3-642-36359-7_25
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-36358-0
Online ISBN: 978-3-642-36359-7
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