Advertisement

Table of contents

  1. Front Matter
    Pages 1-24
  2. Honorary Lecture: Holography Viewed from the Perspective of the Light Field Camera

  3. Topic 1: New Methods and Tools for the Generation, Acquisition, Processing, and Evaluation of Data in Optical Imaging and Metrology

    1. Front Matter
      Pages 23-23
    2. Bernd Bodermann, Rainer Köning, Detlef Bergmann, Wolfgang Häßler-Grohne, Jens Flügge, Harald Bosse
      Pages 35-41
    3. Ignacio Moreno, Jorge Albero, Jeffrey A. Davis, Don M. Cottrell
      Pages 57-62
    4. Goran Bastian Baer, Johannes Schindler, Christof Pruss, Wolfgang Osten
      Pages 87-95
    5. Per Bergström, Davood Khodadad, Emil Hällstig, Mikael Sjödahl
      Pages 103-108
    6. Ting Sun, Yun Li, Lina Xu, Kevin F. Kelly
      Pages 109-115
    7. André Junker, Tim Stenau, Karl-Heinz Brenner
      Pages 117-122
    8. Lysann Megel, Damien P. Kelly, Thomas Meinecke, Stefan Sinzinger
      Pages 123-128
    9. Konstantinos Falaggis, Tomasz Kozacki, Malgorzata Kujawińska, Michał Józwik, Arkadiusz Kuś
      Pages 129-135
    10. Daniel Weigel, Andreas Stark, Holger Babovsky, Armin Kießling, Richard Kowarschik
      Pages 149-154
    11. Samia Heshmat, Satoshi Tomioka, Shusuke Nishiyama
      Pages 155-160
    12. Truong Tho Nguyen, Jonathan M. Huntley, Ian Ashcroft, Pablo D. Ruiz, Fabrice Pierron
      Pages 161-166
    13. Cristina Trillo, Ángel F. Doval, Lidia M. Fontán, José L. Fernández, Pablo Rodríguez-Gómez, J. Carlos López-Vázquez
      Pages 173-178
    14. Vladimir Katkovnik, José Bioucas-Dias, Hongxing Hao
      Pages 179-184
    15. Armando Albertazzi, Analucia V. Fantin, Allison F. Maia, Daniel P. Willemann, Mauro E. Benedet, Matias Viotti
      Pages 191-196
    16. Pierre Slangen, Laurent Aprin, Frédéric Heymes, Pascal Picart
      Pages 203-207
    17. Damien P. Kelly, Lysann Megel, Thomas Meinecke, Stefan Sinzinger
      Pages 213-216
    18. Alexander Schöch, Sabine Linz-Dittrich, Carlo Bach, Andreas Ettemeyer
      Pages 221-224
    19. Krzysztof Pokorski, Krzysztof Patorski
      Pages 225-228
    20. Christian Bräuer-Burchardt, Stefan Heist, Peter Kühmstedt, Gunther Notni
      Pages 229-232
    21. Jean-François Vandenrijt, Marc Georges
      Pages 237-240
    22. Francoise Torner, Jörg Seewig, Thomas Fahlbusch, Günter Beichert, Thomas Böttner
      Pages 241-245
    23. Esmerando Escoto, Joselito Muldera, Lean Dasallas, Elmer Estacio, Percival Almoro
      Pages 247-250
    24. P. T. Samsheerali, Kedar Khare, Joby Joseph
      Pages 255-256
    25. Christoph Zeh, Thomas Härtling
      Pages 271-274
    26. Alberto Aguilar, Abundio Dávila, Enrique Landgrave
      Pages 275-278
    27. Manoj Kumar Sharma, Joby Joseph, Paramasivam Senthilkumaran
      Pages 279-281
    28. Mostafa Agour, Khaled Elshaffey, Christoph von Kopylow, Ralf B. Bergmann, Claas Falldorf
      Pages 283-287

About these proceedings

Introduction

In continuation of the FRINGE Workshop Series this Proceeding contains all contributions presented at the 7. International Workshop on Advanced Optical Imaging and Metrology. The FRINGE Workshop Series is dedicated to the presentation, discussion and dissemination of recent results in Optical Imaging and Metrology. Topics of particular interest for the 7. Workshop are:
- New methods and tools for the generation, acquisition, processing, and evaluation of data in Optical Imaging and Metrology (digital wavefront engineering, computational imaging, model-based reconstruction, compressed sensing, inverse problems solution)
- Application-driven technologies in Optical Imaging and Metrology (high-resolution, adaptive, active, robust, reliable, flexible, in-line, real-time)
- High-dynamic range solutions in Optical Imaging and Metrology (from macro to nano)
- Hybrid technologies in Optical Imaging and Metrology
(hybrid optics, sensor and data fusion, model-based solutions, multimodality)
- New optical sensors, imaging and measurement systems
(integrated, miniaturized, in-line, real-time, traceable, remote)

Special emphasis is put on new strategies, taking into account the active combination of physical modeling, computer aided simulation and experimental data acquisition. In particular attention is directed towards new approaches for the extension of existing resolution limits that open the gates to wide-scale metrology, ranging from macro to nano, by considering dynamic changes and using advanced optical imaging and sensor systems.

Keywords

Adaptive and Active Solution Strategies Compressed Sensing Computational Imaging Digital Wavefront Engineering Hybrid Optics In-line Performance Integration Inverse-Problems Solution Miniaturization Model-Based Reconstruction Technologies Model-Based Solutions Multimodality Real-Time Performance Remote Technology Resolution-Enhanced Technologies Sensor and Data Fusion Traceability

Editors and affiliations

  • Wolfgang Osten
    • 1
  1. 1.Universität Stuttgart Inst. Technische OptikStuttgartGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-36359-7
  • Copyright Information Springer-Verlag Berlin Heidelberg 2014
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Engineering
  • Print ISBN 978-3-642-36358-0
  • Online ISBN 978-3-642-36359-7
  • Buy this book on publisher's site
Industry Sectors
Pharma
Materials & Steel
Automotive
Chemical Manufacturing
Biotechnology
Electronics
Energy, Utilities & Environment
Aerospace
Oil, Gas & Geosciences
Engineering