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X-ray line shape analysis. A means for the characterization of crystalline polymers

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Characterization of Polymers in the Solid State II: Synchrotron Radiation, X-ray Scattering and Electron Microscopy

Part of the book series: Advances in Polymer Science ((POLYMER,volume 67))

Abstract

The profile analysis of WAXS data yields informations in term of crystallite size, microstrain and about the crystallite size and strain distribution.

The average crystalline particle size is derived from the half width line broadening, all other results are calculated from the parameters of the investigated line profile.

The line broadening of the experimental profile consists always of an instrumental line broadening and a structural line broadening. The former could be measured separately by using standard samples, which have infinite large crystallites and have no strains.

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Authors and Affiliations

  1. Polymer Research Institute, H-1950, Budapest, Hungary

    Géza Bodor

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  1. Géza Bodor
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H. H. Kausch H. G. Zachmann

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© 1985 Springer-Verlag

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Bodor, G. (1985). X-ray line shape analysis. A means for the characterization of crystalline polymers. In: Kausch, H.H., Zachmann, H.G. (eds) Characterization of Polymers in the Solid State II: Synchrotron Radiation, X-ray Scattering and Electron Microscopy. Advances in Polymer Science, vol 67. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0016609

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  • DOI: https://doi.org/10.1007/BFb0016609

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-13780-1

  • Online ISBN: 978-3-540-39044-2

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