Characterization of Polymers in the Solid State II: Synchrotron Radiation, X-ray Scattering and Electron Microscopy

Editors

H. H. Kausch
H. G. Zachmann

Conference proceedings

Part of the Advances in Polymer Science book series (POLYMER, volume 67)

Table of contents (6 papers)
About these proceedings

Front Matter

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Synchrotron radiation in polymer science

Gerhard Elsner, Christian Riekel, Hans Gerhard Zachmann

Pages 1-57
Position sensitive X-ray detectors

Jules Hendrix

Pages 59-98
Fluorescence Anisotropy technique using Synchrotron Radiation as a powerful means for studying the orientation correlation functions of polymer chains

Jean-Louis Viovy, Lucien Monnerie

Pages 99-122
Resonance scattering in macromolecular structure research

H. B. Stuhrmann

Pages 123-163
X-ray line shape analysis. A means for the characterization of crystalline polymers

Géza Bodor

Pages 165-193
Use of transmission electron microscopy to obtain quantitative information about polymers

I. G. Voigt-Martin

Pages 195-218
Back Matter

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About these proceedings

Keywords

X-ray crystal electron electron microscopy fluorescence information microscopy polymer polymer science radiation scattering structure synchrotron synchrotron radiation transmission electron microscopy

Bibliographic information

DOI https://doi.org/10.1007/BFb0016604
Publisher Name Springer, Berlin, Heidelberg
eBook Packages Springer Book Archive
Print ISBN 978-3-540-13780-1
Online ISBN 978-3-540-39044-2
Series Print ISSN 0065-3195
Series Online ISSN 1436-5030
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Characterization of Polymers in the Solid State II: Synchrotron Radiation, X-ray Scattering and Electron Microscopy

Table of contents

About these proceedings

Keywords

Bibliographic information