Abstract
This contribution deals with the broad field of electron microscopy. The main objectives are to give a brief overview of the various techniques, with an emphasis on their application in structure analysis, either by direct imaging or by diffraction. Electron microscopy can be done in transmission or in back-scatter mode. The back-scatter mode is used in scanning electron microscopy (SEM). The transmission mode is used in transmission electron microscopy (TEM).
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© 1997 Springer Science+Business Media Dordrecht
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Zandbergen, H.W. (1997). Electron Microscopy Techniques. In: Dorset, D.L., Hovmöller, S., Zou, X. (eds) Electron Crystallography. NATO ASI Series, vol 347. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-8971-0_4
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DOI: https://doi.org/10.1007/978-94-015-8971-0_4
Publisher Name: Springer, Dordrecht
Print ISBN: 978-90-481-4965-0
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