Skip to main content

LSI/VLSI Board Level Guidelines

  • Chapter
Design to Test
  • 75 Accesses

Abstract

Semiconductor manufacturers are now placing on the chip what used to be contained in an entire system. Industry statistics indicate that the number of devices per PCB is not decreasing. Rather, the number of functions per PCB is increasing in order to meet marketing and application demands. The result is that the average 100-IC PCB is far more complex. As the complexity of assemblies increases, the cost to test them increases exponentially (see Figure 5-1).

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Authors

Rights and permissions

Reprints and permissions

Copyright information

© 1990 Jon Turino

About this chapter

Cite this chapter

Turino, J.L. (1990). LSI/VLSI Board Level Guidelines. In: Design to Test. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-6044-5_5

Download citation

  • DOI: https://doi.org/10.1007/978-94-011-6044-5_5

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-011-6046-9

  • Online ISBN: 978-94-011-6044-5

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics