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Design to Test

A Definitive Guide for Electronic Design, Manufacture, and Service

  • Authors
  • Jon L. Turino

Table of contents

  1. Front Matter
    Pages i-xxii
  2. Jon L. Turino
    Pages 1-20
  3. Jon L. Turino
    Pages 21-34
  4. Jon L. Turino
    Pages 35-64
  5. Jon L. Turino
    Pages 65-88
  6. Jon L. Turino
    Pages 89-108
  7. Jon L. Turino
    Pages 109-160
  8. Jon L. Turino
    Pages 161-183
  9. Jon L. Turino
    Pages 185-205
  10. Jon L. Turino
    Pages 207-224
  11. Jon L. Turino
    Pages 225-249
  12. Jon L. Turino
    Pages 251-261
  13. Jon L. Turino
    Pages 263-272
  14. Jon L. Turino
    Pages 273-281
  15. Jon L. Turino
    Pages 283-290
  16. Jon L. Turino
    Pages 291-297
  17. Jon L. Turino
    Pages 299-317
  18. Back Matter
    Pages 319-368

About this book

Introduction

This book is the second edition of Design to Test. The first edition, written by myself and H. Frank Binnendyk and first published in 1982, has undergone several printings and become a standard in many companies, even in some countries. Both Frank and I are very proud of the success that our customers have had in utilizing the information, all of it still applicable to today's electronic designs. But six years is a long time in any technology field. I therefore felt it was time to write a new edition. This new edition, while retaining the basic testability prin­ ciples first documented six years ago, contains the latest material on state-of-the-art testability techniques for electronic devices, boards, and systems and has been completely rewritten and up­ dated. Chapter 15 from the first edition has been converted to an appendix. Chapter 6 has been expanded to cover the latest tech­ nology devices. Chapter 1 has been revised, and several examples throughout the book have been revised and updated. But some­ times the more things change, the more they stay the same. All of the guidelines and information presented in this book deal with the three basic testability principles-partitioning, control, and visibility. They have not changed in years. But many people have gotten smarter about how to implement those three basic test­ ability principles, and it is the aim of this text to enlighten the reader regarding those new (and old) testability implementation techniques.

Keywords

ASIC Counter Hardware LSI VLSI digital signal processor hardware design interconnect microprocessor semiconductor testing

Bibliographic information

  • DOI https://doi.org/10.1007/978-94-011-6044-5
  • Copyright Information Springer Science+Business Media B.V. 1990
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-94-011-6046-9
  • Online ISBN 978-94-011-6044-5
  • Buy this book on publisher's site