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Z-Contrast Scanning Transmission Electron Microscopy

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Impact of Electron and Scanning Probe Microscopy on Materials Research

Part of the book series: NATO Science Series ((NSSE,volume 364))

Abstract

Historically, the development of the transmission electron microscope has followed the path of continually increasing the degree of coherence of the imaging process. This is despite the fact that coherent high resolution images suffer from the phase problem which means they cannot be directly inverted to give the object. Interpretation must necessarily rely on simulation of images of trial objects. Even with the prospect of spherical aberration correction, coherent images will still take many forms depending on objective lens defocus and specimen thickness, and the inversion problem will remain.

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Authors and Affiliations

  1. Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, 37831-6030, USA

    S. J. Pennycook

  2. Nanoscale Physics Research Laboratory, School of Physics and Astronomy, The University of Birmingham, Birmingham, B15 2TT, UK

    P. D. Nellist

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  1. S. J. Pennycook
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  2. P. D. Nellist
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Editors and Affiliations

  1. European Community Joint Research Centre, Ispra, Italy

    David G. Rickerby

  2. Department of Earth and Geo-Environmental Sciences, University of Bologna, Bologna, Italy

    Giovanni Valdrè

  3. Department of Physics, University of Bologna, Bologna, Italy

    Ugo Valdrè

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Pennycook, S.J., Nellist, P.D. (1999). Z-Contrast Scanning Transmission Electron Microscopy. In: Rickerby, D.G., Valdrè, G., Valdrè, U. (eds) Impact of Electron and Scanning Probe Microscopy on Materials Research. NATO Science Series, vol 364. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-4451-3_7

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  • DOI: https://doi.org/10.1007/978-94-011-4451-3_7

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