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Impact of Electron and Scanning Probe Microscopy on Materials Research

  • Book
  • © 1999

Overview

Editors:
  1. David G. Rickerby

    1. European Community Joint Research Centre, Ispra, Italy

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    You can also search for this editor in PubMed   Google Scholar

  2. Giovanni Valdrè

    1. Department of Earth and Geo-Environmental Sciences, University of Bologna, Bologna, Italy

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    You can also search for this editor in PubMed   Google Scholar

  3. Ugo Valdrè

    1. Department of Physics, University of Bologna, Bologna, Italy

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    You can also search for this editor in PubMed   Google Scholar

Part of the book series: NATO Science Series E: (NSSE, volume 364)

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Table of contents (22 chapters)

  1. Front Matter

    Pages i-xxiv
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  2. The Impact of Electron Microscopy on Materials Research

    • Gareth Thomas
    Pages 1-24

  3. Microstructural Design and Tailoring of Advanced Materials

    • Gareth Thomas
    Pages 25-40

  4. Nanostructured Materials

    • Virgil Provenzano
    Pages 41-61

  5. Characterization of Heterophase Transformation Interfaces by High-Resolution Transmission Electron Microscope Techniques

    • J. M. Howe
    Pages 63-108

  6. High Resolution Scanning Electron Microscopy Observations of Nano-Ceramics

    • J.Th.M. De Hosson, M. De Haas, D. H. J. Teeuw
    Pages 109-134

  7. Metal-Ceramic Interfaces Studied with High Resolution Transmission Electron Microscopy

    • J.Th.M. De Hosson, H. B. Groen, B. J. Kooi, W. P. Velinga
    Pages 135-159

  8. Z-Contrast Scanning Transmission Electron Microscopy

    • S. J. Pennycook, P. D. Nellist
    Pages 161-207

  9. Electron Energy Loss Spectrometry in the Electron Microscope

    • L. M. Brown
    Pages 209-230

  10. Electron Energy Loss Spectrometry in the Electron Microscope

    • L. M. Brown
    Pages 231-249

  11. Electron Energy Loss Spectrometry in the Electron Microscope

    • L. M. Brown
    Pages 251-263

  12. Eels Near Edge Structures

    • Gianluigi A. Botton
    Pages 265-300

  13. Surface Chemistry and Microstructure Analysis of Novel Technological Materials

    • Michel L. Trudeau
    Pages 301-323

  14. Convergent Beam Electron Diffraction

    • Colin J. Humphreys
    Pages 325-337

  15. New Developments in Scanning Probe Microscopy

    • E. Meyer, M. Guggisberg, Ch. Loppacher, F. Battiston, T. Gyalog, M. Bammerlin et al.
    Pages 339-357

  16. Low-Energy Scanning Electron Microscope for Nanolithography

    • A. Zlatkin, N. García
    Pages 359-366

  17. Application of Low Voltage Scanning Electron Microscopy and Energy Dispersive X-Ray Spectroscopy

    • D. G. Rickerby
    Pages 367-385

  18. Environmental SEM and Related Applications

    • Thomas A. Hardt
    Pages 387-396

  19. Environmental SEM and Related Applications

    • Thomas A. Hardt
    Pages 397-406

  20. Environmental SEM and Related Applications

    • Thomas A. Hardt
    Pages 407-413
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Keywords

About this book

The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

Editors and Affiliations

  • European Community Joint Research Centre, Ispra, Italy

    David G. Rickerby

  • Department of Earth and Geo-Environmental Sciences, University of Bologna, Bologna, Italy

    Giovanni Valdrè

  • Department of Physics, University of Bologna, Bologna, Italy

    Ugo Valdrè

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