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Impact of Electron and Scanning Probe Microscopy on Materials Research

  • David G. Rickerby
  • Giovanni Valdrè
  • Ugo Valdrè

Part of the NATO Science Series book series (NSSE, volume 364)

Table of contents

  1. Front Matter
    Pages i-xxiv
  2. Virgil Provenzano
    Pages 41-61
  3. J.Th.M. De Hosson, M. De Haas, D. H. J. Teeuw
    Pages 109-134
  4. J.Th.M. De Hosson, H. B. Groen, B. J. Kooi, W. P. Velinga
    Pages 135-159
  5. S. J. Pennycook, P. D. Nellist
    Pages 161-207
  6. Gianluigi A. Botton
    Pages 265-300
  7. Colin J. Humphreys
    Pages 325-337
  8. E. Meyer, M. Guggisberg, Ch. Loppacher, F. Battiston, T. Gyalog, M. Bammerlin et al.
    Pages 339-357
  9. Thomas A. Hardt
    Pages 387-396
  10. Thomas A. Hardt
    Pages 397-406
  11. Thomas A. Hardt
    Pages 407-413
  12. Athene M. Donald, Bradley L. Thiel
    Pages 415-444
  13. Back Matter
    Pages 473-489

About this book

Introduction

The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

Keywords

EELS Electron energy loss spectroscopy alloy ceramics crystal diffraction electron diffraction electron microscope electron microscopy microscopy polymer spectroscopy transmission electron microscopy

Editors and affiliations

  • David G. Rickerby
    • 1
  • Giovanni Valdrè
    • 2
  • Ugo Valdrè
    • 3
  1. 1.European Community Joint Research CentreIspraItaly
  2. 2.Department of Earth and Geo-Environmental SciencesUniversity of BolognaBolognaItaly
  3. 3.Department of PhysicsUniversity of BolognaBolognaItaly

Bibliographic information

  • DOI https://doi.org/10.1007/978-94-011-4451-3
  • Copyright Information Kluwer Academic Publishers 1999
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-0-7923-5940-1
  • Online ISBN 978-94-011-4451-3
  • Series Print ISSN 0168-132X
  • Buy this book on publisher's site
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