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OPTICAL PROPERTIES OF DEFECTS IN SILICA

  • Chapter
Defects in SiO2 and Related Dielectrics: Science and Technology

Part of the book series: NATO Science Series ((NAII,volume 2))

Abstract

The optical properties of point defects are frequently the most important parameter in applications of glassy silica. They are relatively easy to measure on standard spectrophotometers and yield direct information on the quality of practical silica-based devices, e.g., attenuation of fiber-optic waveguides or ultraviolet (UV)- transmitting windows. However, optical measurements alone usually do not give enough information to establish the origin and atomic structure of the respective point defects.

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Authors and Affiliations

  1. Institute of Solid State Physics, University of Latvia, Kengaraga iela 8, LV1063, Riga, Latvia

    L. Skuja

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  1. L. Skuja
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Editors and Affiliations

  1. Dipartimento di Scienza dei Materiali, Università Milano-Bicocca, Milano, Italy

    G. Pacchioni

  2. Institute of Solid State Physics, University of Latvia, Riga, Latvia

    L. Skuja

  3. Naval Research Laboratory, Washington DC, USA

    D. L. Griscom

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Skuja, L. (2000). OPTICAL PROPERTIES OF DEFECTS IN SILICA. In: Pacchioni, G., Skuja, L., Griscom, D.L. (eds) Defects in SiO2 and Related Dielectrics: Science and Technology. NATO Science Series, vol 2. Springer, Dordrecht. https://doi.org/10.1007/978-94-010-0944-7_3

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  • DOI: https://doi.org/10.1007/978-94-010-0944-7_3

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