Abstract
This chapter presents a method to enhance the accuracy of the open-loop T&H circuit, introduced in Chapter 7. The approach is able to measure offset, gain-error and non-linearity on-chip, and to correct for these imperfections by means of analog calibration. The calibration method will be discussed, and both simulation results and experimental results will be shown. Parts of this chapter have been published previously in [75, 76].
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© 2010 Springer Science+Business Media B.V.
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Harpe, P., Hegt, H., van Roermund, A. (2010). T&H Calibration. In: Smart AD and DA Conversion. Analog Circuits and Signal Processing, vol 0. Springer, Dordrecht. https://doi.org/10.1007/978-90-481-9042-3_8
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DOI: https://doi.org/10.1007/978-90-481-9042-3_8
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Publisher Name: Springer, Dordrecht
Print ISBN: 978-90-481-9041-6
Online ISBN: 978-90-481-9042-3
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