Abstract
Field-emission (FE) emitters are indispensable for atomic resolution EMs (ARMs) and analytical EMs (AEMs). Therefore, we had to do best to produce UHV in EMs on market.
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Yoshimura, N. (2014). Ultrahigh Vacuum Electron Microscopes. In: Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes. SpringerBriefs in Applied Sciences and Technology. Springer, Tokyo. https://doi.org/10.1007/978-4-431-54448-7_6
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DOI: https://doi.org/10.1007/978-4-431-54448-7_6
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