3D Thermal/Electrical Simulation of Breakdown in a BJT Using a Circuit Simulator and a Layout-to-Circuit Extraction Tool
A method for the generation of circuit models for fast thermal-electrical simulation of 3D device structures with a circuit simulator is proposed. It has been used for simulation of the influence of layout parameters on the Safe Operating Area of a BJT and to study the mechanisms that start breakdown processes. For a thermally instable switch-on behaviour of a BJT, a comparison with measurements has been made.
KeywordsCircuit Simulator Base Resistance Base Contact Extraction Tool Emitter Area
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