Boundary Condition Models for Terminal Current Fluctuations
A stochastic approach to a recently proposed model of terminal current fluctuations is presented. Two kinds of boundary conditions suitable for noise simulations in semiconductor devices are proposed. The properties and the domain of application of the two models are investigated and the conclusions are drawn from numerical experiments.
KeywordsBoundary Condition Autocovariance Function Noise Simulation Boundary Condition Model Ensemble Monte Carlo
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