Abstract
A stochastic approach to a recently proposed model of terminal current fluctuations is presented. Two kinds of boundary conditions suitable for noise simulations in semiconductor devices are proposed. The properties and the domain of application of the two models are investigated and the conclusions are drawn from numerical experiments.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Reference
L. Varani, T. Kuhn, L. Reggiani, and Y. Perles, “Current and Number Fluctuations in Submicron n+nn+ Structures;’ Solid-State Electron, vol. 36, no. 2, pp. 251–261, 1993.
T. Gonzalez and D. Pardo, “Ensemble Monte Carlo with Poisson Solver for the Study of Current Fluctuations in Homogeneous GaAs Structures,” J.Appl.Phys.,vol. 73, no. 11, pp. 7453–7464, 1993.
J. Adams, T.Tang, and L. Kay, “Monte Carlo Simulation of Noise in GaAs Semiconductor Devices,” IEEE Trans.Electron Devices, vol. 41, no. 4, pp. 575–581,1994.
C. Korman and I. Mayergoyz, “Semiconductor Noise in the Framework of Semiclassical Transport:’ Physical Review B, vol. 54, no. 24, pp. 17620–17627, 1996.
A. Piazza, C. Korman, and A. Jardeh, “A Physics-Based Semiconductor Noise Model Suitable for Efficient Numerical Implementation,” IEEE Trans. Computer-Aided Design, vol. 18, no. 12, pp. 1730–1740, 1999.
H. Kosina, M. Nedjalkov, and S. Selberherr, “A Monte Carlo Method for Small Signal Analysis of the Boltzmann Equation,” JAppl.Phys., vol. 87, no. 9, pp. 4308–4314, 2000.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2001 Springer-Verlag Wien
About this paper
Cite this paper
Nedjalkov, M., Grasser, T., Kosina, H., Selberherr, S. (2001). Boundary Condition Models for Terminal Current Fluctuations. In: Tsoukalas, D., Tsamis, C. (eds) Simulation of Semiconductor Processes and Devices 2001. Springer, Vienna. https://doi.org/10.1007/978-3-7091-6244-6_34
Download citation
DOI: https://doi.org/10.1007/978-3-7091-6244-6_34
Publisher Name: Springer, Vienna
Print ISBN: 978-3-7091-7278-0
Online ISBN: 978-3-7091-6244-6
eBook Packages: Springer Book Archive