2d Hierarchical Radio-Frequency Noise Modeling Based on a Langevin-Type Drift-Diffusion Model and Full-Band Monte-Carlo Generated Local Noise Sources

  • S. Deckert
  • C. Jungemann
  • B. NeinhÜs
  • B. Meinerzhagen
Conference paper


An accurate and efficient 2D drift-diffusion model for thermal noise simulation based on full—band Monte—Carlo (MC) generated local noise sources is presented. Good agreement of the new model and MC device simulations is found for NMOSFETs, whereas previously developed DD based noise models fail. Verification with experiment is shown for a SiGe HBT.


IEDM Tech Excess Noise Factor Diffusion Noise Local Noise Source Drain Current Noise 
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Copyright information

© Springer-Verlag Wien 2001

Authors and Affiliations

  • S. Deckert
    • 1
  • C. Jungemann
    • 1
  • B. NeinhÜs
    • 2
  • B. Meinerzhagen
    • 2
  1. 1.University of BremenBremen
  2. 2.2Present address: Infineon Technologies AGMunich

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