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Mesure d’homogénéité des mélanges de poudres par micro-analyse a sonde électronique

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Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

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Résumé

L’homogénéité des mélanges de poudres destinées à être frittées influence beaucoup les qualités mécaniques, électriques ou magnétiques des matériaux formés. Ce fait est bien connu des fabricants de ferrites [1], de céramiques [2] ou de métaux frittés par exemple.

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Bibliographie

  1. Strivens, M. A.: I.E.E., Conference on Magnetic Materials and their Applications, London 1967, No. 23, p. 168–172.

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  2. Poole, K. R.: Proc. Brit. Ceram. Soc. 3, 43–48 (1965).

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  3. Stange, K.: Chem. Ing. Techn. 26, 331–337 (1954).

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  4. Poole, K. R., R. F. Taylor, and G. P. Wall: Trans. Inst. Chem. Eng. (London) 42, T305–T315 (1964).

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  5. Mdgele, R. A., and H. D. Evans: Ind. Eng. Chem. 43, 1317–1324 (1951).

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Author information

Authors and Affiliations

  1. Laboratoire Central de l’Eclairage, Paris, France

    G. Chol, J. P. Auradon & F. Damay

Authors
  1. G. Chol
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  2. J. P. Auradon
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  3. F. Damay
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Editor information

Editors and Affiliations

  1. Institut für angewandte Physik der Universität, 74, Tübingen, Germany

    G. Möllenstedt  & K. H. Gaukler  & 

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© 1969 Springer-Verlag Berlin Heidelberg

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Chol, G., Auradon, J.P., Damay, F. (1969). Mesure d’homogénéité des mélanges de poudres par micro-analyse a sonde électronique. In: Möllenstedt, G., Gaukler, K.H. (eds) Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-24778-5_84

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  • DOI: https://doi.org/10.1007/978-3-662-24778-5_84

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-22845-6

  • Online ISBN: 978-3-662-24778-5

  • eBook Packages: Springer Book Archive

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