Summary
The article describes an electron probe X-ray micro-analyzer specially designed for mineralogical investigations and constructed for the Department of Mining Engineering of the Technological University, Delft. A miniature magnetic lens is used in the electron optics making it possible to employ a standard Leitz polarization microscope. The specimen can be rotated around the microscope axis and translated in two orthogonal directions.
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References
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© 1969 Springer-Verlag Berlin Heidelberg
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Fontijn, L.A., Bok, A.B., Kornet, J.G. (1969). The TPD Electron Probe X-Ray Micro Analyzer. In: Möllenstedt, G., Gaukler, K.H. (eds) Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-24778-5_40
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DOI: https://doi.org/10.1007/978-3-662-24778-5_40
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-22845-6
Online ISBN: 978-3-662-24778-5
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