Advertisement

Abstract

An instrument was constructed about six years ago as an electron-optical bench for studying the combination of a variety of electron-optical research techniques, principally transmission microscopy and microanalysis, in one instrument. The objects of the present paper are to examine the applications found for the instrument, to relate the scope of them to its design specification and to show how it is hoped to improve the performance in a new design.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    Duncumb, P.: Fifth Internat. Conf. on Electron Microscopy, Paper KK4. New York: Academic Press 1962.Google Scholar
  2. 2.
    Duncumb, P.: The electron microprobe, p. 490. New York: Wiley 1966.Google Scholar
  3. 3.
    HÖhling, H. J.: Naturwissenschaften 6, 142–143 (1967).CrossRefGoogle Scholar
  4. 4.
    Duncumb, P.: J. Microscopie (in press).Google Scholar
  5. 5.
    Philibert, J., and R. Trxner: Brit. J. Appl. Phys., Ser. II, 1, 6, 685 (1968).Google Scholar
  6. 6.
    Cooke, C. J., and P. Duncumb: Proc. Conf. on X-ray Optics and microanalysis, p. 467. Paris: Hermann 1967.Google Scholar
  7. 7.
    Riecxe, W. D.: Optik 5, 273 (1962).Google Scholar
  8. 8.
    LE Poole, J. B.: Proc. 3rd Eur. Conf. on Electron Microscopy, Publ. House Czech. Ac. Sc. Prague, vol. A (1964).Google Scholar
  9. 9.
    HArLes, L.: This conference.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1969

Authors and Affiliations

  • C. J. Cooke
    • 1
  • P. Duncumb
    • 1
  1. 1.Tube Investments Research LaboratoriesCambridgeEngland

Personalised recommendations