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Performance Analysis of a Combined Electron Microscope and Electron Probe Microanalyser “EMMA”

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Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

Abstract

An instrument was constructed about six years ago as an electron-optical bench for studying the combination of a variety of electron-optical research techniques, principally transmission microscopy and microanalysis, in one instrument. The objects of the present paper are to examine the applications found for the instrument, to relate the scope of them to its design specification and to show how it is hoped to improve the performance in a new design.

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References

  1. Duncumb, P.: Fifth Internat. Conf. on Electron Microscopy, Paper KK4. New York: Academic Press 1962.

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Author information

Authors and Affiliations

  1. Tube Investments Research Laboratories, Cambridge, England

    C. J. Cooke & P. Duncumb

Authors
  1. C. J. Cooke
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  2. P. Duncumb
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Editor information

Editors and Affiliations

  1. Institut für angewandte Physik der Universität, 74, Tübingen, Germany

    G. Möllenstedt  & K. H. Gaukler  & 

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© 1969 Springer-Verlag Berlin Heidelberg

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Cooke, C.J., Duncumb, P. (1969). Performance Analysis of a Combined Electron Microscope and Electron Probe Microanalyser “EMMA”. In: Möllenstedt, G., Gaukler, K.H. (eds) Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-24778-5_37

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  • DOI: https://doi.org/10.1007/978-3-662-24778-5_37

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-22845-6

  • Online ISBN: 978-3-662-24778-5

  • eBook Packages: Springer Book Archive

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