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An Experimental Method for Determining the Depth Distribution of Characteristic X-Rays in Electron Microprobe Specimens

  • U. Schmitz
  • P. L. Ryder
  • W. Pitsch

Abstract

An experimental method is described to determine the depth distribution of characteristic X-rays produced in electron microprobe specimens. The results obtained by measurements on Cu are described and compared with results of other methods given in the literature.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1969

Authors and Affiliations

  • U. Schmitz
    • 1
  • P. L. Ryder
    • 1
  • W. Pitsch
    • 1
  1. 1.Max-Planck-Institut für EisenforschungDüsseldorfGermany

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