Abstract
A consistent theory is discussed for the self-consistent screening, the single-particle energy and the dipole plasmon frequency in a one-dimensional electronic system (IDES) with a parabolic confining potential. Comparison with experiments allows a consistent characterisation of the parameters of the IDES.
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References
K.F. Berggren, T.J. Thornton, D.J. Newson, and M. Pepper, Phys. Rev. Lett. 57, 1769 (1986).
W. Hansen, M. Horst, J.P. Kotthaus, U. Merkt, Ch. Sikorski, and K. Ploog, Phys. Rev. Lett. 58, 2586 (1988).
J. Alsmeier, Ch. Sikorski, and U. Merkt, Phys. Rev. B37, 4314 (1988).
F. Brinkop, W. Hansen, J. Kotthaus, and K. Ploog, Phys. Rev. B37, 6547 (1988).
T. Demel, D. Heitmann, P. Grambow, and K. Ploog, Appl. Phys. Lett. 53, 2176 (1988).
T. Demel, D. Heitmann, P. Grambow, and K. Ploog, Phys. Rev. B38, 12732 (1988).
B.J. van Wees, H. van Houten, C.W.J. Beenaker, J.G. Williamson, L.P. Kouwenhoven, D. van der Marel, and C. Foxon, Phys. Rev. Lett. 60, 848 (1988).
S. Laux, D. Frank, and F. Stern, Surf. Sci. 196, 101 (1988).
V. Shikin, T. Demel, and D. Heitmann, ZhETF 96 (1989) 1406.
V. Shikin, T. Demel, and D. Heitmann, Surf. Sci. 229, 276 (1990).
L. Brey, N. Johnson, and P. Halperin, Phys. Rev. B40, 10647 (1989).
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© 1992 Springer-Verlag Berlin Heidelberg
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Shikin, V., Heitmann, D., Demel, T. (1992). Self-Consistent Screening, Single Particle Energy and Plasmon Excitation in a Quasi-One-Dimensional Electronic System. In: Landwehr, G. (eds) High Magnetic Fields in Semiconductor Physics III. Springer Series in Solid-State Sciences, vol 101. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84408-9_44
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DOI: https://doi.org/10.1007/978-3-642-84408-9_44
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