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Ion Pair Production as Main Process of SIMS for Inorganic Solids

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Secondary Ion Mass Spectrometry SIMS V

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 44))

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Abstract

A model of secondary ion emission was proposed [1–3] stating that neutrally emitted molecules dissociate into ion pairs above the surface. A schematic view of this process is shown in Fig. 1.

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References

  1. W. Gerhard and C. Plog Z. Phys. B 54 (1983) 59

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  2. C. Plog and W. Gerhard Z. Phys. B 54 (1983) 71

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  3. C. Plog and W. Gerhard Surf. Sci. 152 /153 (1985) 127

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Author information

Authors and Affiliations

  1. Department NTFG, Dornier System GmbH, Postfach 1360, D-7990, Friedrichhafen, Germany

    C. Plog, G. Roth, W. Gerhard & W. Kerfin

Authors
  1. C. Plog
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  2. G. Roth
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  3. W. Gerhard
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  4. W. Kerfin
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Editor information

Editors and Affiliations

  1. Physikalisches Institut, Universität Münster, Domagkstraße 75, D-4400, Münster, Fed. Rep. of Germany

    Alfred Benninghoven

  2. Chemistry Division, Naval Research Laboratory, 20375, Washington, DC, USA

    Richard J. Colton

  3. Center for Analytical Chemistry, National Bureau of Standards, 20899, Gaithersburg, MD, USA

    David S. Simons

  4. Philips Research Laboratories, NL-Eindhoven, The Netherlands

    Helmut W. Werner

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© 1986 Springer-Verlag Berlin Heidelberg

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Plog, C., Roth, G., Gerhard, W., Kerfin, W. (1986). Ion Pair Production as Main Process of SIMS for Inorganic Solids. In: Benninghoven, A., Colton, R.J., Simons, D.S., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS V. Springer Series in Chemical Physics, vol 44. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82724-2_4

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  • DOI: https://doi.org/10.1007/978-3-642-82724-2_4

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82726-6

  • Online ISBN: 978-3-642-82724-2

  • eBook Packages: Springer Book Archive

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