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Ion Pair Production as Main Process of SIMS for Inorganic Solids

  • C. Plog
  • G. Roth
  • W. Gerhard
  • W. Kerfin
Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 44)

Abstract

A model of secondary ion emission was proposed [1–3] stating that neutrally emitted molecules dissociate into ion pairs above the surface. A schematic view of this process is shown in Fig. 1.

Keywords

Oxygen Pressure Base Pressure Ionic Bond Charge Conservation Oxygen Coverage 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    W. Gerhard and C. Plog Z. Phys. B 54 (1983) 59ADSCrossRefGoogle Scholar
  2. 2.
    C. Plog and W. Gerhard Z. Phys. B 54 (1983) 71ADSCrossRefGoogle Scholar
  3. 3.
    C. Plog and W. Gerhard Surf. Sci. 152 /153 (1985) 127ADSCrossRefGoogle Scholar
  4. 4.
    W. Gerhard Z. Phys. B 22 (1975) 31Google Scholar
  5. 5.
    K. Mann and M.L. Yu SIMS-V conference Washington (1985)Google Scholar
  6. 6.
    H.W. Werner Develop. Appl. Spectr. 7A (1969) 239Google Scholar
  7. 7.
    K. Wittmaack Surf. Sci. 112 (1981) 168ADSCrossRefGoogle Scholar
  8. 8.
    H. Gnaser Int. J. Mass Spec. Ion Proc. 61 (1984) 81CrossRefGoogle Scholar
  9. 9.
    H. Oechsner, W. Rühe and E. Stumpe Surf.Sci. 85 (1979) 289Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1986

Authors and Affiliations

  • C. Plog
    • 1
  • G. Roth
    • 1
  • W. Gerhard
    • 1
  • W. Kerfin
    • 1
  1. 1.Department NTFGDornier System GmbHFriedrichhafenGermany

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