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Secondary Ion Mass Spectrometry SIMS V

Proceedings of the Fifth International Conference, Washington, DC, September 30 – October 4, 1985

  • Alfred Benninghoven
  • Richard J. Colton
  • David S. Simons
  • Helmut W. Werner

Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 44)

Table of contents

  1. Front Matter
    Pages I-XXI
  2. Retrospective

  3. Fundamentals

    1. Front Matter
      Pages 17-17
    2. C. Plog, G. Roth, W. Gerhard, W. Kerfin
      Pages 29-31
    3. S. A. Schwarz
      Pages 38-40
    4. U. Södervall, H. Odelius, A. Lodding, G. Frohberg, K. H. Kraatz, H. Wever
      Pages 41-44
    5. M. M. Brudny, K. D. Klöppel
      Pages 48-50
    6. R. B. Freas, J. E. Campana
      Pages 51-53
    7. B. Schueler, R. Beavis, G. Bolbach, W. Ens, D. E. Main, K. G. Standing
      Pages 57-59
    8. J.-F. Hennequin, R.-L. Inglebert, P. Viaris de Lesegno
      Pages 60-62
  4. Symposium: Detection of Sputtered Neutrals

    1. Front Matter
      Pages 69-69
    2. H. Oechsner
      Pages 70-74
    3. W. W. Harrison, K. R. Hess, R. K. Marcus, F. L. King
      Pages 75-78
    4. G. A. Schick, J. P. Baxter, J. Subbiah-Singh, P. H. Kobrin, N. Winograd
      Pages 90-93
    5. J. Dittmann, F. Leiber, J. Tümpner, A. Benninghoven
      Pages 105-107
    6. D. L. Donohue, W. H. Christie, D. E. Goeringer
      Pages 108-110
  5. Detection Limits and Quantification

    1. Front Matter
      Pages 111-111
    2. J. B. Clegg
      Pages 112-114
    3. F. G. Rüdenauer, W. Steiger, M. Riedel, H. E. Beske, H. Holzbrecher, H. Düsterhöft et al.
      Pages 118-120
  6. Instrumentation

    1. Front Matter
      Pages 131-131
    2. R. Levi-Setti, G. Crow, Y. L. Wang
      Pages 132-138
    3. Tsuyoshi Okutani, T. Shinomiya, M. Ohshima, T. Noda, H. Tamura, H. Watanabe
      Pages 139-141
    4. R. T. Lareau, P. Williams
      Pages 149-151
    5. H. N. Migeon, C. Le Pipec, J. J. Le Goux
      Pages 155-157
    6. K. Miethe, A. Pöcker
      Pages 164-166
    7. Liangzhen Cha, Zuqing Xue, Ziqiang Rao, Weihua Liu, Yuqing Tong
      Pages 167-169
    8. E. Zinner, A. J. Fahey, K. D. McKeegan
      Pages 170-172
    9. M. G. Dowsett, J. W. Heal, H. Fox, E. H. C. Parker
      Pages 176-178

About these proceedings

Keywords

Atom Diffusion Sorption adsorption catalyst chemistry crystal hydrogen isotope mass spectrometry materials science metals microscopy spectrometry structure

Editors and affiliations

  • Alfred Benninghoven
    • 1
  • Richard J. Colton
    • 2
  • David S. Simons
    • 3
  • Helmut W. Werner
    • 4
  1. 1.Physikalisches InstitutUniversität MünsterMünsterFed. Rep. of Germany
  2. 2.Chemistry DivisionNaval Research LaboratoryUSA
  3. 3.Center for Analytical ChemistryNational Bureau of StandardsGaithersburgUSA
  4. 4.Philips Research LaboratoriesNL-EindhovenThe Netherlands

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-82724-2
  • Copyright Information Springer-Verlag Berlin Heidelberg 1986
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-82726-6
  • Online ISBN 978-3-642-82724-2
  • Series Print ISSN 0172-6218
  • Buy this book on publisher's site
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