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Matrix Effects in the Quantitative Elemental Analysis of Plastic-Embedded and Ashed Biological Tissue by SIMS

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Secondary Ion Mass Spectrometry SIMS V

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 44))

Abstract

Quantitative analysis of single matrix materials using the ion microprobe mode of SIMS analysis is now routinely achieved using empirical standards. Quantification in multilayer/multimatrix specimens has also been realized in recent years (1). However, ion imaging based on SIMS has been chiefly qualitative in nature due to artifacts in the SIMS measurement. Among these, the inability to precisely calibrate ionization probability variations due to matrix composition variation over an ion image field is probably the most difficult variable to account for. This is true because precise matrix composition from pixel is seldom known with sufficient accuracy to allow fabrication of external standards.

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References

  1. Galuska, AA, Ph.D. Thesis, Cornell University, 1984.

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Author information

Author notes

  1. J. T. Brenna

    Present address: Systems Technology Division, IBM, Endicott, New York, USA

Authors and Affiliations

  1. Baker Laboratory of Chemistry, Cornell University, Ithaca, NY, 14853, USA

    J. T. Brenna & G. H. Morrison

Authors
  1. J. T. Brenna
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  2. G. H. Morrison
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Editor information

Editors and Affiliations

  1. Physikalisches Institut, Universität Münster, Domagkstraße 75, D-4400, Münster, Fed. Rep. of Germany

    Alfred Benninghoven

  2. Chemistry Division, Naval Research Laboratory, 20375, Washington, DC, USA

    Richard J. Colton

  3. Center for Analytical Chemistry, National Bureau of Standards, 20899, Gaithersburg, MD, USA

    David S. Simons

  4. Philips Research Laboratories, NL-Eindhoven, The Netherlands

    Helmut W. Werner

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© 1986 Springer-Verlag Berlin Heidelberg

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Brenna, J.T., Morrison, G.H. (1986). Matrix Effects in the Quantitative Elemental Analysis of Plastic-Embedded and Ashed Biological Tissue by SIMS. In: Benninghoven, A., Colton, R.J., Simons, D.S., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS V. Springer Series in Chemical Physics, vol 44. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82724-2_29

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  • DOI: https://doi.org/10.1007/978-3-642-82724-2_29

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82726-6

  • Online ISBN: 978-3-642-82724-2

  • eBook Packages: Springer Book Archive

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