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Time-of-Flight Measurements in Secondary Ion Mass Spectrometry

  • K. G. Standing
  • R. Beavis
  • G. Bolbach
  • W. Ens
  • D. E. Main
  • B. Schueler
Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 44)

Abstract

In recent years a number of mass spectrometers have been constructed for measuring the mass spectra of secondary ions by time-of-flight methods [1]. References The secondary ions may be produced by bombardment of the sample with high energy (MeV) primary ions [2] or with low-energy (keV) ions. Instruments using both low-energy ion bombardment (SIMS) and time-of-flight (TOF) are listed in table 1.

Keywords

Fission Fragment Ally Topic Liquid Matrix Quadrupole Spectrometer Large Vapor Pressure 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    For a review of earlier work on TOF mass spectrometers see D. Price and G.J. Milnes, Int. J. Mass Spectrom. Ion Processes 60, 61 (1984)CrossRefGoogle Scholar
  2. 2.
    See papers by R.D. Macfarlane and by B. Sundqvist; these proceedingsGoogle Scholar
  3. 3.
    B.T.Chait & K.G.Standing, Int. J. Mass Spectrom. IonPhys 40, 185 (1981)Google Scholar
  4. 4.
    K.G. Standing, R. Beavis, W. Ens and B. Schueler, Int. J. Mass Spectrom. Ion Phys 53, 125 (1983)ADSCrossRefGoogle Scholar
  5. 5.
    P. Steffens, E. Niehuis, T. Friese and A. Benninghoven, in Ion Formation from Organic Solids Ed. A. Benninghoven, Springer Series in Chemical Physics (Springer, Berlin, 1983) Vol. 25, p. 111; A. Benninghoven, ibid. p. 64Google Scholar
  6. 6.
    P. Steffens, E. Niehuis, T. Friese, D. Greifendorf and A. Benninghoven, in Secondary Ion Mass Spectrometry SIMS IV, Ed. A. Benninghoven et al, Springer Series in Chemical Physics (Springer, Berlin, 1984) Vol 36, p. 404; A. Benninghoven, ibid. p. 342Google Scholar
  7. 7.
    P. Steffens, E. Niehuis, T. Friese, D. Greigendorf and A. Benninghoven J. Vac. Sci. Technol. A3, 1322 (1985)Google Scholar
  8. 8.
    W. P. Poschenrieder, Int. J. Mass Spectrom. Ion Phys 9, 357 (1972); G.H. Oetjen and W.P. Poschenrieder, ibid. 16, 353 (1975)Google Scholar
  9. 9.
    B.T. Chait and F.H. Field, 32nd Annual Conference on Mass Spectrometry and Allied Topics ( Am. Soc. for Mass Spectrometry 1984 ) p. 237Google Scholar
  10. 10.
    B. Sundqvist, private communicationGoogle Scholar
  11. 11.
    R.J. Cotter, Anal. Chem. 56, 2594 (1984)CrossRefGoogle Scholar
  12. 12.
    E. Niehuis, T. Friese, H. Feld and A. Benninghoven, these proceedingsGoogle Scholar
  13. 13.
    K.G. Standing et al, to be submittedGoogle Scholar
  14. 14.
    R.D. Macfarlane & D. Torgerson, Int. J. Mass Spectrom. Ion Phys. 21, 81 (1976)CrossRefGoogle Scholar
  15. 15.
    R.D. Macfarlane, Anal. Chem. 55, 1247A (1983)Google Scholar
  16. 16.
    W.Ens, K.G.Standing, B.T.Chait & F.H.Field, Anal. Chem. 53, 1241 (1981)Google Scholar
  17. 17.
    K.G. Standing, B.T. Chait, W. Ens, G. McIntosh, and R. Beavis, Nucl. Instr. and Meth. 198, 33 (1982)CrossRefGoogle Scholar
  18. 18.
    B. Schueler, R. Beavis, W. Ens, D.E. Main and K.G. Standing, Surface Sci. 160, 571 (1985)ADSCrossRefGoogle Scholar
  19. 19.
    R.F. Bonner, D.V. Bowen, B.T. Chait, A. Lipton, F.H. Field, and W.F. Sippach, Anal. Chem. 52, 1923 (1980)CrossRefGoogle Scholar
  20. 20.
    W. Ens, R. Beavis, G. Bolbach, D. Main, B. Schueler and K.G. Standing, submitted to Nucl. Instr. and Meth.; also these proceedingsGoogle Scholar
  21. 21.
    J.F. Holland, C.G. Enke, J. Allison, J.T. Stults, J.D. Pinkston, B. Newcome and J.T. Watson, Anal. Chem. 55, 997A (1983)Google Scholar
  22. 22.
    See the paper by K.L. Rinehart, Jr. in these proceedingsGoogle Scholar
  23. 23.
    A. Benninghoven, M. Junach and W. Sichtermann, 32nd Annual Conference on Mass Spectrometry and Allied Topics (American Society for Mass Spectrometry 1984 ) p. 251Google Scholar
  24. 24.
    A. Benninghoven, E. Niehuis, T. Friese, D. Greifendorf, and P. Steffens, Org. Mass Spectrom. 19, 346 (1984)CrossRefGoogle Scholar
  25. 25.
    B.T.Chait and F.H.Field, Int. J. Mass Spectrom. Ion Phys. 41, 17 (1981)Google Scholar
  26. 26.
    W. Ens, R. Beavis and K.G. Standing, Phys. Rev. Lett. 50, 27 (1983)ADSCrossRefGoogle Scholar
  27. 27.
    P. Demirev, M. Alai, R. van Breeman, R.J. Cotter and C. Fenselau, these proceedingsGoogle Scholar
  28. 28.
    H. Wollnik in Ion Formation from Organic Solids, (IFOS III) Munster 1985, to be published by SpringerGoogle Scholar
  29. 29.
    B.A. Mamyrin, V.I. Karataev, D.V. Schmikk and U.A. Zagulin, Sov. Phys. JETP 37, 45 (1973)ADSGoogle Scholar
  30. 30.
    S. Della Negra and Y. Le Beyec, Int. J. Mass Spectrom. Ion Processes 61, 21 (1984)CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1986

Authors and Affiliations

  • K. G. Standing
    • 1
  • R. Beavis
    • 1
  • G. Bolbach
    • 1
  • W. Ens
    • 1
  • D. E. Main
    • 1
  • B. Schueler
    • 1
  1. 1.Physics DepartmentUniversity of ManitobaWinnipegCanada

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