Abstract
Using the filter elution technique it is possible to measure DNA double-strand breaks (dsb) in the same dose range as cell survival measurements. Unlike other techniques for measuring dsb, the dose-effect relationship for dsb induction with low LET radiation is non-linear with dose. The shape of the induction curve mirrors that of the cell survival curve such that a plot of lethal lesions (-ln[surviving fraction]) versus dsb produces a linear relationship (Radford, 1985). We have repeated these measurements for radiations of differing linear energy transfer (LET) and for breaks induced chemically by H2O2 treatment. The yield of DNA dsb and cell survival in Chinese hamster V79 cells were measured after irradiation at 4°C by 400 keV electrons, 250 kVp X-rays, 1.90 MeV, 1.15 MeV, 0.76 MeV protons, 2.3 MeV neutrons and 3.8 MeV 238Pu α-particles. For H2O2 treatment, cells were incubated with the drug (10–5–10–2M) for 20 minutes also at 4°C. Depending on the source used, cells were irradiated in suspension (X-rays and neutrons), attached on 13mm diameter Thermanox coverslips (electrons) or collected onto polyvinylidine difluoride membrane filters (protons, α-particles and H2O2). Immediately after irradiation, cells were assayed for DNA dsb using the filter elution technique (pH9.6) or assayed for their colony-forming ability.
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References
Fox JC, McNally NJ (1988) Cell survival and DNA double-strand break repair following X-ray or neutron irradiation of V79 cells. Int J Radiat Biol 54: 1021–1030
Radford IR (1985) The level of induced DNA double-strand breaks correlates with cell killing after X-irradiation. Int J Radiat Biol 48: 45–54
Ward JF (1985) Biochemistry of DNA lesions. Rad Res 104: S103–S111
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© 1991 Springer-Verlag Berlin Heidelberg
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Prise, K.M., Folkard, M., Davies, S., Michael, B.D. (1991). The Lethality of Radiation-Induced DNA Double-Strand Breaks for Radiations of Differing LET. In: Fielden, E.M., O’Neill, P. (eds) The Early Effects of Radiation on DNA. NATO ASI Series, vol 54. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-75148-6_9
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DOI: https://doi.org/10.1007/978-3-642-75148-6_9
Publisher Name: Springer, Berlin, Heidelberg
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