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SIMS Analysis of TiO2, Including Depth Profiling

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Secondary Ion Mass Spectrometry SIMS II

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 9))

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Abstract

Titanium dioxide shows a blue coloration after being placed in contact with a sodium amalgam at room temperature [1]. Sodium and hydrogen diffuse during treatment. Water decomposition by an electrochemical cell with an n-TiO2 electrode (treated in a H2 gas atmosphere) was first demonstrated by FUJISHIMA and HONDA [2], The characterization of the surface structure and chemical composition of the active TiO2 surface is needed in order to understand the mechanisms of the photocatalytic reaction and the coloration process [3,4].

l Work partially supported by PNCB-CONACYT (Mexico) and SEPAFIN (Mexico).

3 Also in Escuela Superior de Fisica y Matematicas del IPN.

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References

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Author information

Authors and Affiliations

  1. Laboratory for Surface Studies and Department of Physics, University of Wisconsin, Milwaukee, Wisconsin 53201, USA

    J. L. Peña

  2. Departamento de fisica, Centro de Investigacion del, Instituto Politecnico Nacionai, Apartado Postal 14-740, Mexico 14, DF, USA

    M. H. Farias & F. Sanchez-Sinencio

  3. F.C Fisico-Mathematicas, UANL, Monterrey N.L., Mexico, USA

    F. Sanchez-Sinencio

Authors
  1. J. L. Peña
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  2. M. H. Farias
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  3. F. Sanchez-Sinencio
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Editor information

Editors and Affiliations

  1. Physikalisches Institut der Universität Münster, Germany

    A. Benninghoven

  2. Charles Evans & Associates, San Mateo, CA, 94402, USA

    C. A. Evans Jr.

  3. Varian Associates, Palo Alto, CA, 94303, USA

    R. A. Powell

  4. Osaka University, Osaka, Japan

    R. Shimizu

  5. General Electric Vallecitos Nuclear Center, Pleasanton, CA, 94566, USA

    H. A. Storms

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© 1979 Springer-Verlag New York

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Peña, J.L., Farias, M.H., Sanchez-Sinencio, F. (1979). SIMS Analysis of TiO2, Including Depth Profiling. In: Benninghoven, A., Evans, C.A., Powell, R.A., Shimizu, R., Storms, H.A. (eds) Secondary Ion Mass Spectrometry SIMS II. Springer Series in Chemical Physics, vol 9. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-61871-0_67

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  • DOI: https://doi.org/10.1007/978-3-642-61871-0_67

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-61873-4

  • Online ISBN: 978-3-642-61871-0

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