Abstract
The ability of the ion microprobe or SIMS instrument to distinguish between isotopes and to analyze thin layers sequentially by sputtering provides unique methods well suited for studying oxidation and corrosion mechanisms. Although many SIMS studies of oxidation have been reported, very few have taken advantage of isotope substitution [1–4], The ability to directly observe the order and direction of events in a corrosion reaction in relatively thin films should be of importance to metallurgists and material scientists, particularly those who are interested in oxidation or corrosion at relatively low temperatures or under mild conditions.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
S.S. Cristy, D.V. Ferree, T.A. Nolan, and W.H. McCulla, Studies of Oxide and Fluoride Films on Metals Using an Ion Microprobe Mass Analyzer, Y-DA-4815, Union Carbide Corporation-Nuclear Division, Oak Ridge Y-12 Plant, Oak Ridge, TN; 1972.
M. Croset and D. Dieumegard, Corrosion Science, 16, 703 (1976).
C.A. Evans, Jr., and J.P. Pemsler, Anal. Chem., 42, 1060 (1970).
J.A. McHugh, Methods of Surface Analysis, A.W. Czanderna, ed., p. 269 (Elsevier Scientific Publishing Co., New York, 1975).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1979 Springer-Verlag New York
About this paper
Cite this paper
Cristy, S.S., Condon, J.B. (1979). Investigation of Metal Corrosion Mechanisms Using Stable Isotopes with the Ion Microprobe. In: Benninghoven, A., Evans, C.A., Powell, R.A., Shimizu, R., Storms, H.A. (eds) Secondary Ion Mass Spectrometry SIMS II. Springer Series in Chemical Physics, vol 9. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-61871-0_44
Download citation
DOI: https://doi.org/10.1007/978-3-642-61871-0_44
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-61873-4
Online ISBN: 978-3-642-61871-0
eBook Packages: Springer Book Archive