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Trace Element Analysis of Silicates by Ion Microprobe

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Secondary Ion Mass Spectrometry SIMS II

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 9))

Abstract

Quantitative ion microprobe analysis of silicates for trace element concentrations requires the close intercomparison of unknowns with standards using identical instrumental conditions and an internal standard such as silicon. Data from various silicate standards can be compared by relative sensitivities of elements calculated with respect to silicon [1].

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References

  1. J.A. McHugh (1974) Secondary ion mass spectrometry. In Methods and Phenomena: Methods of Surface Analysis. Eds., Wolsky and Czanderna, Elsevier

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Author information

Authors and Affiliations

  1. SN7-NASA Johnson Space Center, Houston, Texas, 77058, USA

    C. Meyer Jr.

Authors
  1. C. Meyer Jr.
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Editor information

Editors and Affiliations

  1. Physikalisches Institut der Universität Münster, Germany

    A. Benninghoven

  2. Charles Evans & Associates, San Mateo, CA, 94402, USA

    C. A. Evans Jr.

  3. Varian Associates, Palo Alto, CA, 94303, USA

    R. A. Powell

  4. Osaka University, Osaka, Japan

    R. Shimizu

  5. General Electric Vallecitos Nuclear Center, Pleasanton, CA, 94566, USA

    H. A. Storms

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© 1979 Springer-Verlag New York

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Meyer, C. (1979). Trace Element Analysis of Silicates by Ion Microprobe. In: Benninghoven, A., Evans, C.A., Powell, R.A., Shimizu, R., Storms, H.A. (eds) Secondary Ion Mass Spectrometry SIMS II. Springer Series in Chemical Physics, vol 9. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-61871-0_20

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  • DOI: https://doi.org/10.1007/978-3-642-61871-0_20

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-61873-4

  • Online ISBN: 978-3-642-61871-0

  • eBook Packages: Springer Book Archive

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