Abstract
There has been an explosion of interest in metal oxide surfaces in the past decade. This reflects the technological importance of these surfaces in, for instance, catalysis and electronics, as well as the availability of techniques to make their study tractable. There still remains a problem in connection with the large and important class of oxides that are insulating. This prevents their study by a number of techniques, including STM. In principle, NC-AFM offers an alternative imaging tool for insulators. As a step towards this goal we have explored the use of NC-AFM in imaging surface reconstructions and metal growth on a number of oxide surfaces at atomic or close-to-atomic resolution. Most of these surfaces were chosen to have a sufficiently high conductivity to allow their characterisation using conventional methods.
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Pang, C.L., Thornton, G. (2002). NC-AFM Imaging of Surface Reconstructions and Metal Growth on Oxides. In: Morita, S., Wiesendanger, R., Meyer, E. (eds) Noncontact Atomic Force Microscopy. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-56019-4_9
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DOI: https://doi.org/10.1007/978-3-642-56019-4_9
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