Editors:
- This book is a top state-of-the-art report on all the methods in noncontact atomic force microscopy prepared by the leading experts in the field
- Includes supplementary material: sn.pub/extras
Part of the book series: NanoScience and Technology (NANO)
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Table of contents (20 chapters)
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Front Matter
About this book
Reviews
"This book gives a comprehensive overview of the state-of-the-art of this dynamic force microscopy technique in 20 chapters, each written by experts in the field. It covers the theoretical basis, as well as applications to semiconducting surfaces, ionic crystals, metal oxides, and organic molecular systems including thin films, polymers, and nucleic acids . . . There are unsolved questions about the mechanisms responsible for atomic resolution but, as this well-written book displays, there has been tremendous progress in basic understanding of the technique and fascinating new applications continue to arise . . . With an increased understanding of NC-AFM, as demonstrated in this book, we are certain to see further progress in the near future."
–Materials Today
Editors and Affiliations
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Department of Electronic Engineering, Graduate School of Engineering, Osaka University, Suita, Japan
S. Morita
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Institute of Applied Physics, MARCH, University of Hamburg, Hamburg, Germany
R. Wiesendanger
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Department of Physics and Astronomy, Condensed Matter Division, University of Basel, Basel, Switzerland
E. Meyer
Bibliographic Information
Book Title: Noncontact Atomic Force Microscopy
Editors: S. Morita, R. Wiesendanger, E. Meyer
Series Title: NanoScience and Technology
DOI: https://doi.org/10.1007/978-3-642-56019-4
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 2002
Hardcover ISBN: 978-3-540-43117-6Published: 24 July 2002
Softcover ISBN: 978-3-642-62772-9Published: 23 October 2012
eBook ISBN: 978-3-642-56019-4Published: 06 December 2012
Series ISSN: 1434-4904
Series E-ISSN: 2197-7127
Edition Number: 1
Number of Pages: XVIII, 440
Topics: Nanotechnology, Surfaces and Interfaces, Thin Films, Measurement Science and Instrumentation, Characterization and Evaluation of Materials
Industry Sectors: Biotechnology, Chemical Manufacturing, Electronics, IT & Software, Materials & Steel