Noncontact Atomic Force Microscopy

  • S. Morita
  • R. Wiesendanger
  • E. Meyer

Part of the NanoScience and Technology book series (NANO)

Table of contents

  1. Front Matter
    Pages I-XVIII
  2. Seizo Morita
    Pages 1-10
  3. Franz J. Giessibl
    Pages 11-46
  4. Seizo Morita, Yasuhiro Sugawara
    Pages 47-77
  5. Roland Bennewitz, Martin Bammerlin, Ernst Meyer
    Pages 93-107
  6. Michael Reichling, Clemens Barth
    Pages 109-123
  7. Hirotaka Hosoi, Kazuhisa Sueoka, Kazunobu Hayakawa, Koichi Mukasa
    Pages 125-134
  8. Ken-ichi Fukui, Yasuhiro Iwasawa
    Pages 167-181
  9. Yasuhiro Sugawara
    Pages 183-192
  10. Hirofumi Yamada
    Pages 193-213
  11. Akira Sasahara, Hiroshi Onishi
    Pages 215-231
  12. Wolf Allers, Alexander Schwarz, Udo D. Schwarz
    Pages 233-256
  13. Masaru Tsukada, Naruo Sasaki, Michel Gauthier, Katsunori Tagami, Satoshi Watanabe
    Pages 257-278
  14. San-Huang Ke, Tsuyoshi Uda, Kiyoyuki Terakura, Ruben Pérez, Ivan Štich
    Pages 279-304
  15. Adam Foster, Alexander Shluger, Clemens Barth, Michael Reichling
    Pages 305-347
  16. Hendrik Hölscher
    Pages 349-369
  17. Michel Gauthier, Lev Kantorovich, Masaru Tsukada
    Pages 371-394

About this book

Introduction

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Keywords

AFM Bias Helium-Atom-Streuung Noncontact atomic True atomic resolution deformation experiment measurement microscopy oxides semiconductor semiconductors spectroscopy surface temperature

Editors and affiliations

  • S. Morita
    • 1
  • R. Wiesendanger
    • 2
  • E. Meyer
    • 3
  1. 1.Department of Electronic Engineering, Graduate School of EngineeringOsaka UniversitySuitaJapan
  2. 2.Institute of Applied Physics, MARCHUniversity of HamburgHamburgGermany
  3. 3.Department of Physics and Astronomy, Condensed Matter DivisionUniversity of BaselBaselSwitzerland

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-56019-4
  • Copyright Information Springer-Verlag Berlin Heidelberg 2002
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-62772-9
  • Online ISBN 978-3-642-56019-4
  • Series Print ISSN 1434-4904
  • About this book
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