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Durchstrahlungsmikroskope

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Vierter Internationaler Kongress für Elektronenmikroskopie / Fourth International Conference on Electron Microscopy / Quatrième Congrès International de Microscopie Électronique

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Abstract

A research electron microscope with an accelerating voltage up to 350 kV was developed. High tension is generated by means of step-up transformers, and fed to the three-stage accelerators through a coaxial cable which avoids exposing the highest tension. Thus the corona and leakage loss are minimized and the fluctuation of voltage is kept in the order of 10-5. The electron beam from the gun is adjusted by both static and magnetic deflectors. The intermediate and projector lenses are adjustable to the optical axis of the objective lens merely by moving their pole pieces. All lenses can be replaced or removed from the side without disassembling the microscope body. This microscope, thus designed, can be adapted to any electron diffraction studies. Even heat-sensitive organic specimens keep their original structures in this microscope, and it is possible to obtain distinct diffraction patterns from any selected area. Solid materials can be investigated more extensively; the transitions of crystals and phases are also easily followed by applying the heating or cooling devices. The most interesting application of this instrument is stereoscopy, that is, the three-dimensional observation of inner structures, which otherwise are attainable only by laborious observations of successive ultra thin sections.

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Authors and Affiliations

  1. Institute for Chem. Research, Central Research Laboratory, Shimadzu Seisakusho, Kyoto University, Kyoto, Japan

    K. Kobayashi, E. Suito & S. Shimadzu

  2. Hitachi Zentral-Forschungslaboratorium, Tokyo, Japan

    B. Tadano, S. Katagiri, K. Ichige, Y. Sakaki & S. Maruse

  3. Elektrotechnisches Institut, Universität Nagoya, Japan

    B. Tadano, S. Katagiri, K. Ichige, Y. Sakaki & S. Maruse

  4. Research Institute for Scientific Measurement, Tohoku University, Sendai, Japan

    T. Hibi & S. Takahashi

  5. Philips Research Laboratories, Philips Phys. Techn. X-ray Lab., N. V. Philips Gloeilampenfabrieken, Eindhoven, Netherlands

    A. C. van Dorsten & S. L. van den Broek

  6. Elektronenmikroskopisches Laboratorium, Universität Basel, Deutschland

    M. Gribi, M. Thürkauf, W. Villiger & L. Wegmann

  7. Trüb, Täuber & Co. AG., Zürich, Deutschland

    M. Gribi, M. Thürkauf, W. Villiger & L. Wegmann

  8. Akashi Seisakusho, Ltd., Tokyo, Japan

    Kazuhiko Akashi, Tatsunosuke Masuda & Hiroshi Tochigi

  9. Elektroinstitut, Universität Ljubljana, Jugoslawien

    A. Strojnik

  10. Institut für Elektronenmikroskopie am Fritz-Haber-Institut, Max-Planck-Gesellschaft, Berlin-Dahlem, Deutschland

    K. Müller, E. Ruska & W. D. Riecke

  11. Department of Human Anatomy, University of Oxford, UK

    G. A. Meek

Authors
  1. K. Kobayashi
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  2. E. Suito
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  3. S. Shimadzu
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  4. B. Tadano
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  5. S. Katagiri
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  6. K. Ichige
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  7. Y. Sakaki
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  8. S. Maruse
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  9. T. Hibi
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  10. S. Takahashi
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  11. A. C. van Dorsten
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  12. S. L. van den Broek
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  13. M. Gribi
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  14. M. Thürkauf
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  15. W. Villiger
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  16. L. Wegmann
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  17. Kazuhiko Akashi
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  18. Tatsunosuke Masuda
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  19. Hiroshi Tochigi
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  20. A. Strojnik
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  21. K. Müller
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  22. E. Ruska
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  23. G. A. Meek
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  24. W. D. Riecke
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Editor information

W. Bargmann G. Möllenstedt H. Niehrs D. Peters E. Ruska C. Wolpers

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© 1960 Springer-Verlag OHG. Berlin · Göttingen · Heidelberg

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Kobayashi, K. et al. (1960). Durchstrahlungsmikroskope. In: Bargmann, W., Möllenstedt, G., Niehrs, H., Peters, D., Ruska, E., Wolpers, C. (eds) Vierter Internationaler Kongress für Elektronenmikroskopie / Fourth International Conference on Electron Microscopy / Quatrième Congrès International de Microscopie Électronique. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-49765-0_11

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  • DOI: https://doi.org/10.1007/978-3-642-49765-0_11

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-49481-9

  • Online ISBN: 978-3-642-49765-0

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