abstract
For studying the evaporation of millimetre-sized drops of liquids techniques such as video-microscope imaging and ultra-precision weighing with electronic microbalances or with quartz crystal microbalances have been employed in the past decades. Similar techniques are, however, hardly applicable to microscopic drops. Moreover, they do not provide a measure of the interfacial stresses arising at the contact area between liquid and solid. Here we demonstrate the use of atomic force microscope (AFM) cantilevers as sensitive stress, mass, and temperature sensors for monitoring the evaporation of microdrops of water from solid surfaces. Starting from considerations on drops in equilibrium, we will further discuss evaporating drops and details of the experimental technique. We will show how the evaporation of water microdrops on a hydrophobic surface differs from the evaporation on a hydrophilic surface, and how this difference becomes more pronounced towards the end of evaporation. We further show that one-side metal-coated cantilevers, acting as bimetals, allow measuring the average temperature of an evaporating microdrop. Finally, we will discuss two further applications of microdrops evaporating on cantilevers, namely testing the local cleanliness of cantilevers’ surfaces and calibrating cantilevers’ spring constants.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Heilmann J, Lindqvist U (2000) J Imag Sci Technol 44:491
Socol Y, Berenstein L, Melamed O, Zaban A, Nitzan B (2004) J Imag Sci Technol 48:15
Kim EK, Ekerdt JG, Willson CG (2005) J Vac Sci Technol B 23:1515
Tullo AH (2002) Chem Eng News 80:27
Chou FC, Gong SC, Chung CR, Wang MW, Chang CY (2004) Jap J Appl Phys 1 43:5609
Fabbri M, Jiang SJ, Dhir VK (2005) J Heat Mass Transf 127:38
Amon CH, Yao SC, Wu CF, Hsieh CC (2005) J Heat Transf Trans ASME 127:66
Shedd TA (2007) Heat Transf Eng 28:87
“Fogtech International”. www.fogtec-international.com
Kawase T, Sirringhaus H, Friend RH, Shimoda T (2001) Adv Mater 13:1601
Bonaccurso E, Butt HJ, Hankeln B, Niesenhaus B, Graf K (2005) Appl Phys Lett 86:124101
de Gans BJ, Hoeppener S, Schubert US (2006) Adv Mater 18:910
Karabasheva S, Baluschev S, Graf K (2006) Appl Phys Lett 89:031110
Ionescu RE, Marks RS, Gheber LA (2003) Nano Letters 3:1639
Lefebvre AH (1989) Atomization and Sprays. Taylor & Francis
Lee ER (2003) Microdrop Generation. CRC Press, Taylor and Francis
Edwards BF, Wilder JW, Scime EE (2001) Eur J Phys 22:113
Bourges-Monnier C, Shanahan MER (1995) Langmuir 11:2820
Rowan SM, Newton MI, McHale G (1995) J Phys Chem 99:13268
Birdi KS, Vu DT, Winter A (1989) J Phys Chem 93:3702
Picknett RG, Bexon R (1977) J Colloid Interface Sci 61:336
Pham NT, McHale G, Newton MI, Carroll BJ, Rowan SM (2004) Langmuir 20:841
Bonaccurso E, Butt HJ (2005) J Phys Chem B 109:253
Haschke T, Bonaccurso E, Butt H-J, Lautenschlager D, Schönfeld F, Wiechert W (2006) J Micromech Microeng 16:2273
Golovko DS, Haschke T, Wiechert W, Bonaccurso E (2007) Rev Sci Instrum 78:043705
Obrien RN, Saville P (1987) Langmuir 3:41
Cordeiro RM, Pakula T (2005) J Phys Chem B 109:4152
Soolaman DM, Yu HZ (2005) J Phys Chem B 109:17967
Butt HJ, Golovko DS, Bonaccurso E (2007) J Phys Chem B 111:5277
Cleveland JP, Manne S, Bocek D, Hansma PK (1993) Rev Sci Instrum 64:403
David S, Sefiane K, Tadrist L (2007) Colloid Surf A 298:108
Blinov VI, Dobrynina VV (1971) J Eng Phys Thermophys 21:229
Golovko DS, Bonanno P, Lorenzoni S, Raiteri R, Bonaccurso E (2008) J Micromech Microeng 18:095026
Butt HJ, Cappella B, Kappl M (2005) Surface Science Reports 59:1–152
Cappella B, Dietler G (1999) Surf Sci Rep 34:1
Burnham NA, Chen X, Hodges CS, Matei GA, Thoreson EJ, Roberts CJ, Davies MC, Tendler SJB (2003) Nanotechnology 14:1
Ralston J, Larson I, Rutland MW, Feiler AA, Kleijn M (2005) Pure Appl Chem 77:2149
Green CP, Lioe H, Cleveland JP, Proksch R, Mulvaney P, Sader JE (2004) Rev Sci Instrum 75:1988
Green CP, Sader JE (2002) J Appl Phys 92:6262
Green CP, Sader JE (2005) J Appl Phys 98:114913
Green CP, Sader JE (2005) Phys Fluids 17:073102
Higgins MJ, Proksch R, Sader JE, Polcik M, Mc Endoo S, Cleveland JP, Jarvis SP (2006) Rev Sci Instrum 77:013701
Sader JE (1998) J Appl Phys 84:64
Sader JE, Chon JWM, Mulvaney P (1999) Rev Sci Instrum 70:3967
Sader JE, Larson I, Mulvaney P, White LR (1995) Rev Sci Instrum 66:3789
Butt H-J, Jaschke M (1995) Nanotechnology 6:1
Hutter JL, Bechhoefer J (1993) Rev Sci Instrum 64:1868
Craig VSJ, Neto C (2001) Langmuir 17:6018
Notley SM, Biggs S, Craig VSJ (2003) Rev Sci Instrum 74:4026
Senden TJ, Ducker WA (1994) Langmuir 10:1003
Maeda N, Senden TJ (2000) Langmuir 16:9282
Torii A, Sasaki M, Hane K, Okuma S (1996) Meas Sci Technol 7:179
Tortonese M, Kirk M (1997) SPIE Proc 3009:53
Bonaccurso E, Schonfeld F, Butt HJ (2006) Phys Rev B 74:085413
Thundat T, Zheng X-Y, Chen GY, Sharp SL, Warmack RJ (1993) Appl Phys Lett 63:2150
Mate CM, McClelland GM, Erlandsson R, Chiang S (1987) Phys Rev Lett 59:1942
Marti O, Colchero J, Mlynek J (1990) Nanotechnology 1:141
Meyer E, Lüthi R, Howald L, MBammerlin M, Guggisberg M, Güntherodt H-J (1996) J Vac Sci Technol B 14:1285
Tsukruk VV, Bliznyuk VN (1998) Langmuir 14:446
Butt H-J (1991) Biophys J 60:1438
Ducker WA, Senden TJ, Pashley RM (1991) Nature 353:239
Florin E-L, Moy VT, Gaub HE (1994) Science 264:415
Hinterdorfer P, Baumgartner W, Gruber HJ, Schilcher K, Schindler H (1996) Proc Nat Acad Sci USA 93:3477
Radmacher M (1999) Physics World 12:33
Heinz WF, Hoh J (1999) Nanotechnology 17:143
Lee GU, Kidwell DA, Colton RJ (1994) Langmuir 10:354
Hoh J, Cleveland JP, Prater CB, Revel J-P, Hansma PK (1992) J Am Chem Soc 114:4917
Heim L-O, Blum J, Preuss M, Butt H-J (1999) Phys Rev Lett 83:3328
Berger R, Gerber C, Lang HP, Gimzewski JK (1997) Microel Eng 35:373
Fritz J, Baller MK, Lang HP, Rothuizen H, Vettiger P, Meyer E, Güntherodt H-J, Gerber C, Gimzewski JK (2000) Science 288:316
Raiteri R, Grattarola M, Butt H-J, Skladal P (2001) Sens Actuators B 79:115
Lang HP, Hegner M, Meyer E, Gerber C (2002) Nanotechnology 13:R29
Knapp HF, Stemmer A (1999) Surf Interface Anal 27:324
Lo Y, Huefner ND, Chan WS, Dryden P, Hagenhoff B, Beebe TP (1999) Langmuir 15:6522
Arai T, Tomitori M (1998) Appl Phys A 66:S319
Fujihira M, Okabe Y, Tani Y, Furugori M, Akiba U (2000) Ultramicroscopy 82:181
Senden TJ, Drummond CJ (1995) Coll Surf A: Physicochem Eng Asp 94:29
Bonaccurso E, Gillies G (2004) Langmuir 20:11824
Rights and permissions
Copyright information
© 2009 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Bonaccurso, E. et al. (2009). Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation. In: Applied Scanning Probe Methods XI. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85037-3_2
Download citation
DOI: https://doi.org/10.1007/978-3-540-85037-3_2
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-85036-6
Online ISBN: 978-3-540-85037-3
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)